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The Award database is continually updated throughout the year. As a result, data for FY23 is not expected to be complete until September, 2024.

Download all SBIR.gov award data either with award abstracts (290MB) or without award abstracts (65MB). A data dictionary and additional information is located on the Data Resource Page. Files are refreshed monthly.

The SBIR.gov award data files now contain the required fields to calculate award timeliness for individual awards or for an agency or branch. Additional information on calculating award timeliness is available on the Data Resource Page.

  1. Negative Electron Affinity Diamond Vacuum Collector Transistor

    SBC: Advanced Technologies/Laboratories Intl            Topic: N/A

    SEMICONDUCTING DIAMOND HAS MANY NOVEL PROPERTIES, MOST NOTABLY A STABLE NEGATIVE ELECTRON AFFINITY SURFACE. CONDUCTION BAND ELECTRONS ARE READILY EMITTED FROM A NEGATIVE ELECTRON AFFINITY (NEA) MATERIAL BECAUSE THE BULK CONDUCTION BAND LIES ABOVE THE VACUUM LEVEL. IN THE PHASE I PROGRAM WE WILL CONSTRUCT A NEGATIVE ELECTRON AFFINITY DIAMOND VACUUM COLLECTOR TRANSISTOR AND INVESTIGATE THE PERFORMAN ...

    SBIR Phase I 1993 Department of DefenseMissile Defense Agency
  2. Thick PLZT films for Integrated spatial light Modulators

    SBC: Advanced Technologies/Laboratories Intl            Topic: N/A

    Over the past twenty years two-dimensional spatial light modulators (SLM's) have been identified as a critical element in a many applications. While large electro-optic effects can be engineered in composite structures such as multiple quantum-wells or liquid crystals, SLM's based on ceramic materials in the PbLaZrTiO3 (PLZT) family of compounds show a unique combination of high transparency iind ...

    SBIR Phase I 1993 Department of DefenseAir Force
  3. Electro-Optic PLZT Films for Monolithic Tunable Band-Pass Filters

    SBC: Advanced Technologies/Laboratories Intl            Topic: N/A

    Electrically tunable optical filters have been identified as a critical element in many applications, including imaging and automated target recognition applications. While large electro-optic effects can be engineered in composite structures such as multiple quantum-wells or liquid crystals, SLMs based on ceramic materials in the PbLaZrTiO3 (PLZT) family of compounds show a unique combination of ...

    SBIR Phase I 1993 Department of DefenseAir Force
  4. Low Valent Titanium Source Reagents for MOCVD of Titanium Nitride

    SBC: Advanced Technologies/Laboratories Intl            Topic: N/A

    TITANIUM NITRIDE (TiN) IS RAPIDLY BECOMING AN IMPORTANT MATERIAL AS A BARRIER LAYER IN VLSI DRAMs, AS AN ANTIREFLECTION COATING AND AS A "GLUE" LAYER BETWEEN NOBLE METALS AND SILICON DIOXIDE IN BOTH MEMORY AND LOGIC DEVICES. TYPICALLY, THIN FILMS OF TiN ARE DEPOSITED BY PHYSICAL VAPOR DEPOSITION METHODS, BUT AS DEVICE FEATURE SIZES SHRINK TO ULSI DIMENSIONS, CHEMICAL VAPOR DEPOSITION (CVD) WILL BE ...

    SBIR Phase I 1993 Department of DefenseMissile Defense Agency
  5. Residual Stress/fracture Modeling Of HTSC Films

    SBC: Advanced Technologies/Laboratories Intl            Topic: N/A

    High quality thin films of high temperature superconductor (HTSC) materials have been grown by a variety of methods. Independent of the growth method, residual stresses in large area HTSC/dielectric multi-layer films, resulting from both thermal expansion and lattice mismatch, continue to be a problem. In Phase I, ATM, working with Dr. Stewart Kurtz of Pennsylvania State University, will calculate ...

    SBIR Phase I 1993 Department of DefenseDefense Advanced Research Projects Agency
  6. Improved Tungsten Penetrators

    SBC: Advanced Technologies/Laboratories Intl            Topic: N/A

    Kinetic energy penetrators are currently relied upon as a way to defeat enemy armor. Historically these penetrators have been composed of unanium or tungsten based alloys due to their high densities. In addition to density, the deformation behavior of the alloy determines it's performance. A penetrator whose tip mushrooms or fractures on impact is less effective than a penetrator that retains it's ...

    SBIR Phase I 1993 Department of DefenseArmy
  7. DIAMOND-BASED PHOTOMULTIPLIERS

    SBC: Advanced Technologies/Laboratories Intl            Topic: N/A

    THE UNIQUE PROPERTIES OF SSEMICONDUCTING DIAMOND MAY BE EXPLOITED TO CREATE A NOVEL, HIGH GAIN, LOW NOISE, STABLE, AND COMPACT PHOTOMULTIPLER (PMT). EXISTING PMTS ARE INADEQUATE FOR MANY APPLICATIONS WHERE SENSITIVITY AND GAIN MUST BE COMBINED WITH STABILITY AND REDUCED NOISE REQUIREMENTS. A NOVEL APPROACH TO THE DEVELOPMENT OF A COMPACT PHOTOMULTIPLIER IS PLANNED WHICH MEETS THESE REQUIREMENTS. T ...

    SBIR Phase I 1993 Department of Energy
  8. PHOTO CHEMICAL VAPOR DEPOSITION OF BARIUM TITANATE

    SBC: Advanced Technologies/Laboratories Intl            Topic: N/A

    FERROELECTRICS SHOW GREAT PROMISE AS ELECTRONIC MATERIALS IN APPLICATIONS RANGING FROM INFRARED DETECTORS TO OPTICAL SWITCHES. BRIUM TITANATE (BATIO3) IS AN ESPECIALLY PROMISING MATERIAL FOR THIN FILM CAPACITOR APPLICATIONS IN ULTRA-LARGE SCALE INTEGRATED CIRCUITS. CONVENTIONAL CHEMICAL VAPOR DEPOSITION (CVD) PROCESSING OF BATIO3 THIN FILMS REQUIRES TEMPERATURES THAT ARE INCOMPATIBLE WITH STANDARD ...

    SBIR Phase I 1993 National Science Foundation
  9. NOVEL SOURCES FOR TITANIUM NITRIDE CHEMICAL VAPOR DEPOSITION (CVD)

    SBC: Advanced Technologies/Laboratories Intl            Topic: N/A

    TITANIUM NITRIDE (TIN) IS BECOMING AN IMPORTANT MATERIAL AS A BARRIER LAYER IN VLSI DRAMS, AS AN ANTIREFLECTION COATING AND AS A "GLUE" LAYER BETWEEN NOBLE METALS AND SILICON DIOXIDE IN BOTH MEMORY AND LOGIC DEVICES. THIN FILMS OF TIN ARE DEPOSITED BY PHYSICAL VAPOR DEPOSITION METHODS, BUT AS DEVICE FEATURE SIZES SHRINK TO ULSI DIMENSIONS, CHEMICAL VAPOR DEPOSITION (CVD) IS THE MANUFACTURING METHO ...

    SBIR Phase I 1993 National Science Foundation
  10. PORTABLE ON-LINE X-RAY DIFFRACTION SYSTEM

    SBC: Advanced Technologies/Laboratories Intl            Topic: N/A

    SPUTTER COATING IS A WIDELY USED COMMERCIAL TECHNIQUE FOR PRODUCING THIN FILM COATINGS. IN-SITU MONITORING OF CRITICAL THIN FILM PROPERTISE WOULD GREATLY ENHANCE PROCESS CONTROL IN A VARIETY OF SPUTTER COATING PROCESSES. TRADITIONAL 0/20 SCANNING X-RAY DIFFRACTOMETERS ARE POWERFUL ANALYSIS TOOLS CAPABLE OF MEASURING THIN FILM PROPERTISE SUCH AS PHASE COMPOSITION, DEGREE OF CRYSTALLINITY, PREFERRED ...

    SBIR Phase I 1993 National Science Foundation
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