Award Data

Army logisticians and fleet managers need an effective method to extract actionable information from their large data stores. They need to extract root cause and case-based analysis to diagnose or predict breakdowns. An Enterprise Intelligence System that extracts data from multiple sources, fuses that information, and disseminates the results in the form of products on the readiness of fleet vehi ...

The potential for radio communications to be used in asymmetric operations against coalition forces has grown exponentially and has expanded well beyond the now-familiar IED detonators. Expeditionary forces, in particular, convoys on the move, need an effective counter surveillance capability to combat this threat. Following a very successful Phase I effort, the team of 21st Century Systems Incorp ...

As technologies utilizing THz radiation (light) develop, the optical properties for many materials need to be determined accurately as a function of frequency in a variety of applications including: THz threat detection and security screening applications

"A military combat unit must "see" the battlefield better than the enemy, decide sooner than the enemy what to do, "move" to fight effectively and "shoot" to destroy the enemy. As the US Army moves toward weapons systems for the digital battlefield, newer,lighter weight and more capable hardware is emerging. These digital systems may not realize better "seeing", that is, situational awareness. Co ...

THE NEED FOR SMALLER SEMICONDUCTOR DEVICE STRUCTURES FOR USE IN VERY HIGH SPEED MICROELECTRONICS REQUIRES A NEW GENERATION OF PLASMA ETCHING TECHNOLOGY. ECR PROMISES TO PROVIDE FEATURES AS SMALL AS 0.2 MICRONS IN SIZE, AS WELL AS A HIGH DEGREE OF ETCHING ANISOTROPY, SELECTIVITY, ETCH RATES, AND LOW DAMAGE. FOR MANUFACTURING PROCESS CONTROL INVOLVING ECR ETCHING IN PRODUCTION OF ELECTRONICS AND OPT ...

II-VI SEMICONDUCTORS, ESPECIALLY HGCDTE, ARE USED EXTENSIVELY IN INFRARED IMAGING AND NIGHT VISION ELECTRONICS. THESE SEMICONDUCTORS HAVE SOFT SURFACES; GROWTH OF DEVICE QUALITY MATERIAL IS DIFFICULT; DEVICE YIELDS ARE LOW, AND COSTS ARE HIGH. THERE IS THUS A GREAT NEED FOR NON-INVASIVE PROCESS CONTROL. RECENTLY OUR COMPANY HAS DEVELOPED IN SITU SPECTROSCOPIC ELLIPSOMETRY FOR THE MONITOR OF AL(X)G ...