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The Characterization and Mitigation of Single Event Effects in Ultra-Deep Submicron (< 90nm) MicroelectronicsSBC: Orora Design Technologies, Inc. Topic: DTRA07005
Orora Design Technologies proposes to develop electronic design automation (EDA) tools employing minimally invasive circuit design-based methods to mitigate single event effects (SEEs) for next generation Ultra-DSM CMOS (SBIR Phase II 2008 Department of DefenseDefense Threat Reduction Agency