You are here

Award Data

For best search results, use the search terms first and then apply the filters
Reset

The Award database is continually updated throughout the year. As a result, data for FY20 is not expected to be complete until September, 2021.

  1. N/A

    SBC: MANUFACTURING INSTRUMENTATION CONSULTANT            Topic: N/A

    Scanning Probe Microscopy (SPM) has become a very popular tool in many areas of inquiry including surface science, semiconductor electronic devices and integrated circuit design and testing, biology and chip-tissue interface, to name a few. Here we propose to develop and commercialize a relatively new family of local probes capable of performing electromagnetic measurements with nearly atomic ...

    SBIR Phase II 2001 Department of Commerce
US Flag An Official Website of the United States Government