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Award Data

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The Award database is continually updated throughout the year. As a result, data for FY24 is not expected to be complete until March, 2025.

Download all SBIR.gov award data either with award abstracts (290MB) or without award abstracts (65MB). A data dictionary and additional information is located on the Data Resource Page. Files are refreshed monthly.

The SBIR.gov award data files now contain the required fields to calculate award timeliness for individual awards or for an agency or branch. Additional information on calculating award timeliness is available on the Data Resource Page.

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  1. IN-SITU MANUFACTURING CONTROL BY ELLIPSOMETRY

    SBC: Woollam J A Co            Topic: N/A

    N/A

    SBIR Phase II 1992 Department of DefenseDefense Advanced Research Projects Agency

  2. NON-INVASIVE CONTROL OF II-VI SEMICONDUCTOR GROWTH

    SBC: Woollam J A Co            Topic: N/A

    N/A

    SBIR Phase II 1992 Department of DefenseDefense Advanced Research Projects Agency

  3. MONOLAYER RESOLUTION CHARACTERIZATION BY VARIABLE ANGLE SPECTROSCOPIC ELLIPSOMETRY (VASE)

    SBC: Woollam J A Co            Topic: N/A

    ELLIPSOMETRY USES POLARIZED LIGHT REFLECTANCE TO CHARACTERIZE SURFACES, INTERFACES, AND THIN FILMS. ELLIPSOMETRY HAS TRADITIONALLY BEEN DONE USING A FEW (USUALLY ONE) DISCRETE ANGLES OF INCIDENCE OF THE LIGHT BEAM WITH A SURFACE NORMAL, AND A FEW SELECTED WAVELENGTHS (FREQUENTLY ONLY 632.8 NM FROM A HENE LASER). RECENTLY IT WAS SHOWN (BY WOOLLAM AND COWORKERS) THAT USING VARIABLE ANGLE OF INCIDENC ...

    SBIR Phase II 1988 Department of DefenseDefense Advanced Research Projects Agency
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