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Award Data

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The Award database is continually updated throughout the year. As a result, data for FY20 is not expected to be complete until September, 2021.

  1. Metrology of thin films on sapphire substrate

    SBC: Optowares Incorporated            Topic: DMEA16B001

    There is a lack of non-destructive metrology tool to measure the thickness of thin films on sapphire substrate due to the transparency of the

    STTR Phase I 2017 Department of DefenseDefense Microelectronics Activity
  2. Botnet Analytics Appliance (BNA)

    SBC: MILCORD LLC            Topic: N/A

    As reported by Internet security threat reports, Bot networks are becoming the focal point for cybercriminals. Milcord and the University of Wisconsin, responds to this challenge with our proposal ¿ a ¿Bayesian Activity Monitor for Botnet Defense¿ (BAM-BD). In this proposal, we will research, design, and develop a botnet detection and mitigation tool that automatically classifies botnet behavio ...

    STTR Phase I 2006 Department of Homeland Security
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