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Award Data

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The Award database is continually updated throughout the year. As a result, data for FY20 is not expected to be complete until September, 2021.

  1. Near Atomic Spatial Resolution Electrical Characterization

    SBC: SPM Labs LLC            Topic: DMEA19B001

    The proposal “Down to Atomic Resolution Kelvin Probing of Integrated Circuits (DARK-PICs)” deals with improvement of Kelvin Force Microscopy (KFM) allowing detection/mapping of surface potential and related electric properties of semiconductors and integrated circuits at the atomic scale. This Phase I deals with the feasibility of developing a commercially KFM system with a spatial resolution ...

    STTR Phase I 2020 Department of DefenseDefense Microelectronics Activity
  2. Advanced Predictive Modeling of Radiation Effects in ReRAM Devices based on electrical characterization augmented by imaging data

    SBC: Desert Microtechnology Associates, Inc.            Topic: 20A001

    In an effort to improve the design of radiation hardened electronic components, this proposal explores the feasibility of creating predictive modeling techniques for nanoscale material properties in advanced integrated electrical devices. This study encompasses the collaborative usage of high resolution Transmission Electron Microscope (HR-TEM) data, circuit design targeted electrical data, and ma ...

    STTR Phase I 2020 Department of DefenseDefense Microelectronics Activity
  3. Predictive device modeling for radiation effects through machine learning

    SBC: Alphacore, Inc.            Topic: 20A001

    Alphacore will evaluate and develop a new approach to multi-scale modeling of radiation effects in electronic device technologies based on novel material systems. Our approach aims to directly correlate nano-scale properties of novel materials systems with macro-scale electrical properties of devices constructed with those materials, and their radiation response. Radiation hardness assurance (RHA) ...

    STTR Phase I 2020 Department of DefenseDefense Microelectronics Activity
  4. Metrology of thin films on sapphire substrate

    SBC: Optowares Incorporated            Topic: DMEA16B001

    There is a lack of non-destructive metrology tool to measure the thickness of thin films on sapphire substrate due to the transparency of the

    STTR Phase I 2017 Department of DefenseDefense Microelectronics Activity
  5. Innovative 2D/3D Building, Asset, and Resource Tracking Visualization Tool

    SBC: KUTTA TECHNOLOGIES, INC.            Topic: N/A

    In this proposal, Kutta capitalizes on existing DOD investments and its own 2D and 3D visualization tools, and leverages the world-renowned computer graphics department at Arizona State University (ASU). This prior work experience and knowledge allows the team to build a resource and asset tracking tool for incident commanders with powerful 2D and 3D visualization capabilities. Kutta and its prest ...

    STTR Phase I 2006 Department of Homeland Security
  6. Botnet Analytics Appliance (BNA)

    SBC: MILCORD LLC            Topic: N/A

    As reported by Internet security threat reports, Bot networks are becoming the focal point for cybercriminals. Milcord and the University of Wisconsin, responds to this challenge with our proposal ¿ a ¿Bayesian Activity Monitor for Botnet Defense¿ (BAM-BD). In this proposal, we will research, design, and develop a botnet detection and mitigation tool that automatically classifies botnet behavio ...

    STTR Phase I 2006 Department of Homeland Security
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