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Award Data

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The Award database is continually updated throughout the year. As a result, data for FY24 is not expected to be complete until March, 2025.

Download all SBIR.gov award data either with award abstracts (290MB) or without award abstracts (65MB). A data dictionary and additional information is located on the Data Resource Page. Files are refreshed monthly.

The SBIR.gov award data files now contain the required fields to calculate award timeliness for individual awards or for an agency or branch. Additional information on calculating award timeliness is available on the Data Resource Page.

  1. Metrology of thin films on sapphire substrate

    SBC: OPTOWARES INC            Topic: DMEA16B001

    There is a lack of non-destructive metrology tool to measure the thickness of thin films on sapphire substrate due to the transparency of the

    STTR Phase I 2017 Department of DefenseDefense Microelectronics Activity
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