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The Award database is continually updated throughout the year. As a result, data for FY24 is not expected to be complete until March, 2025.

Download all SBIR.gov award data either with award abstracts (290MB) or without award abstracts (65MB). A data dictionary and additional information is located on the Data Resource Page. Files are refreshed monthly.

The SBIR.gov award data files now contain the required fields to calculate award timeliness for individual awards or for an agency or branch. Additional information on calculating award timeliness is available on the Data Resource Page.

  1. Bounding generalization risk for Deep Neural Networks

    SBC: Euler Scientific            Topic: NGA20A001

    Deep Neural Networks have become ubiquitous in the modern analysis of voluminous datasets with geometric symmetries. In the field of Particle Physics, experiments such as DUNE require the detection of particle signatures interacting within the detector, with analyses of over a billion 3D event images per channel each year; with typical setups containing over 150,000 different channels.  In an ...

    STTR Phase I 2020 Department of DefenseNational Geospatial-Intelligence Agency
  2. Hybrid DNN-based Transfer Learning and CNN-based Supervised Learning for Object Recognition in Multi-modal Infrared Imagery

    SBC: TOYON RESEARCH CORPORATION            Topic: 1

    On this effort Toyon Research Corp. and The Pennsylvania State University are developing deep learning-based algorithms for object recognition and new class discovery in look-down infrared (IR) imagery. Our approach involves the development of a hybrid classifier that exploits both transfer learning and semi-supervised paradigms in order to maintain good generalization accuracy, especially when li ...

    STTR Phase I 2018 Department of DefenseNational Geospatial-Intelligence Agency
  3. Metrology of thin films on sapphire substrate

    SBC: OPTOWARES INC            Topic: DMEA16B001

    There is a lack of non-destructive metrology tool to measure the thickness of thin films on sapphire substrate due to the transparency of the

    STTR Phase I 2017 Department of DefenseDefense Microelectronics Activity
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