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The Award database is continually updated throughout the year. As a result, data for FY19 is not expected to be complete until April, 2020.
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Metrology of thin films on sapphire substrate
SBC: Optowares Incorporated Topic: DMEA16B001There is a lack of non-destructive metrology tool to measure the thickness of thin films on sapphire substrate due to the transparency of the
STTR Phase I 2017 Department of DefenseDefense Microelectronics Activity
