List

For best search results, use the search terms first and then apply the filters
Reset

The Award database is continually updated throughout the year. As a result, data for FY19 is not expected to be complete until April, 2020.

  1. Holographic Projection Laser Marking System (HoloMark)

    SBC: Luminit LLC            Topic: DMEA172002

    To address the DMEA need for Through-Lens Fiducial Marking System, Luminit, LLC proposes to develop a new Holographic Projection Laser Marking System (HoloMark). This proposed device is based on a new design that utilizes Luminit-developed mature components like computer-generated hologram technology. The innovation will enable precise, fast and lower cost marks on any substrate, consistent with t ...

    SBIR Phase I 2018 Department of DefenseDefense Microelectronics Activity
  2. Laser Alignment and Infrared Inspection

    SBC: PHYSICAL OPTICS CORPORATION            Topic: DMEA172002

    To address the DMEAs need to perform failure analysis on microelectronic components using infrared microscope systems to locate areas of interest and then navigate accurately to these same locations in a focused ion beam tool, Physical Optics Corporation (POC) proposes to develop a new Laser Alignment and Infrared Inspection (LAIRI) system. It is based upon the integration of a state-of-the-art co ...

    SBIR Phase I 2018 Department of DefenseDefense Microelectronics Activity
  3. Through-Lens Fiducial Marking System

    SBC: Checkpoint Technologies LLC            Topic: DMEA172002

    The objective of this proposal is to demonstrate the feasibility of the innovative development of a tool that can be integrated into an IR microscope that is able to create fiducial marks on the surface of the backside of silicon.The current state-of-art in semiconductor device analysis involves procedures that begin with the identification of areas of interest under an IR microscope and then thos ...

    SBIR Phase I 2018 Department of DefenseDefense Microelectronics Activity
  4. In-situ Fiducial Marker

    SBC: Hedgefog Research Inc.            Topic: DMEA172002

    To address the DMEA's need for a through-lens fiducial marker technology in semiconductor device inspection, Hedgefog Research Inc. (HFR) proposes to develop a new In-situ Fiducial Marker (IFM), based on laser-activated, electrostatically assisted marking at designated spots. Novel system features in IFM will enable non-destructive fiducial marking (diameter < 5 micron) in real time while operatin ...

    SBIR Phase I 2018 Department of DefenseDefense Microelectronics Activity
  5. High-brilliance 11keV X-ray Source

    SBC: Sigray, Inc.            Topic: DMEA162001

    This Small Business Innovation Proposal aims to establish the feasibility of developing a high flux x-ray source using a patent-pending microstructured anode comprised of Platinum microstructures embedded in a diamond substrate. The resulting source will provide a breakthrough in achievable throughput for the application of rapid integrated circuit (IC) inspection, due to two major innovative adva ...

    SBIR Phase I 2017 Department of DefenseDefense Microelectronics Activity
  6. Ferroelectric X-Ray Generator (FLEX)

    SBC: Luminit LLC            Topic: DMEA162001

    To address the DMEA need for rapid x-ray inspection of large volumes of integrated circuits (ICs), Luminit, LLC, proposes to develop a new compact, high-brilliance x-ray source: the Ferroelectric X-Ray Generator (FLEX). This proposed device is based on an innovative combination of a ferroelectric, photogalvanic crystal combined with an undulator. The innovation in the physical principles of compac ...

    SBIR Phase I 2017 Department of DefenseDefense Microelectronics Activity
  7. High-Efficiency Integrated Si APD Quantum Key Receiver

    SBC: Freedom Photonics LLC            Topic: DMEA142001

    Abstract

    SBIR Phase II 2017 Department of DefenseDefense Microelectronics Activity
  8. High-Resolution X-ray Microscopy Image Acquisition, 3D Reconstruction, and Analysis SoftwareSystem

    SBC: PHYSICAL OPTICS CORPORATION            Topic: DMEA152002

    To address the DMEA need for algorithms and software to accurately analyze data from X-ray microscopy of integrated circuits (ICs), PhysicalOptics Corporation (POC) proposes to develop a new X-ray Microscopy Image Acquisition, 3D Reconstruction, and Analysis Software (XARA)system for rapid identification and mapping of conductors of ICs. It is based on (a) novel swing nanolaminography image acquis ...

    SBIR Phase I 2016 Department of DefenseDefense Microelectronics Activity
  9. ZnS Scintillator for High Resolution X-ray Imaging at 9keV

    SBC: CERANOVA CORPORATION            Topic: DMEA15B001

    Novel scintillator materials are needed to address the requirements of fast, high resolution x-ray microscopy, including higher stopping power and light yields. Achieving the required high efficiency and high spatial resolution is challenging and depends strongly on the scintillator characteristics. Knowledge of the details of the trap states can lead to significantly reduced afterglow and fast ...

    SBIR Phase I 2016 Department of DefenseDefense Microelectronics Activity
  10. New Sensor for 9 keV HRXM

    SBC: Radiation Monitoring Devices, Inc.            Topic: DMEA15B001

    The use of penetrating radiation such as x-rays allows probing materials for their internal structure through direct imaging methods in a non-destructive way. X-rays as more penetrating and with shorter wavelengths than visible light allow imaging internal structures with better resolution. The resolution of details can reach nm sizes. This is realized in High Resolution X-ray Microscopy (HRXM). ...

    SBIR Phase I 2016 Department of DefenseDefense Microelectronics Activity

Agency Micro-sites

SBA logo
Department of Agriculture logo
Department of Commerce logo
Department of Defense logo
Department of Education logo
Department of Energy logo
Department of Health and Human Services logo
Department of Homeland Security logo
Department of Transportation logo
Environmental Protection Agency logo
National Aeronautics and Space Administration logo
National Science Foundation logo
US Flag An Official Website of the United States Government