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Award Data
The Award database is continually updated throughout the year. As a result, data for FY24 is not expected to be complete until March, 2025.
Download all SBIR.gov award data either with award abstracts (290MB)
or without award abstracts (65MB).
A data dictionary and additional information is located on the Data Resource Page. Files are refreshed monthly.
The SBIR.gov award data files now contain the required fields to calculate award timeliness for individual awards or for an agency or branch. Additional information on calculating award timeliness is available on the Data Resource Page.
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Holographic Projection Laser Marking System (HoloMark)
SBC: Luminit LLC Topic: DMEA172002To address the DMEA need for Through-Lens Fiducial Marking System, Luminit, LLC proposes to develop a new Holographic Projection Laser Marking System (HoloMark). This proposed device is based on a new design that utilizes Luminit-developed mature components like computer-generated hologram technology. The innovation will enable precise, fast and lower cost marks on any substrate, consistent with t ...
SBIR Phase I 2018 Department of DefenseDefense Microelectronics Activity -
Laser Alignment and Infrared Inspection
SBC: Physical Optics Corporation Topic: DMEA172002To address the DMEAs need to perform failure analysis on microelectronic components using infrared microscope systems to locate areas of interest and then navigate accurately to these same locations in a focused ion beam tool, Physical Optics Corporation (POC) proposes to develop a new Laser Alignment and Infrared Inspection (LAIRI) system. It is based upon the integration of a state-of-the-art co ...
SBIR Phase I 2018 Department of DefenseDefense Microelectronics Activity -
Through-Lens Fiducial Marking System
SBC: Checkpoint Technologies LLC Topic: DMEA172002The objective of this proposal is to demonstrate the feasibility of the innovative development of a tool that can be integrated into an IR microscope that is able to create fiducial marks on the surface of the backside of silicon.The current state-of-art in semiconductor device analysis involves procedures that begin with the identification of areas of interest under an IR microscope and then thos ...
SBIR Phase I 2018 Department of DefenseDefense Microelectronics Activity -
In-situ Fiducial Marker
SBC: HEDGEFOG RESEARCH INC. Topic: DMEA172002To address the DMEA's need for a through-lens fiducial marker technology in semiconductor device inspection, Hedgefog Research Inc. (HFR) proposes to develop a new In-situ Fiducial Marker (IFM), based on laser-activated, electrostatically assisted marking at designated spots. Novel system features in IFM will enable non-destructive fiducial marking (diameter < 5 micron) in real time while operatin ...
SBIR Phase I 2018 Department of DefenseDefense Microelectronics Activity