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The Award database is continually updated throughout the year. As a result, data for FY19 is not expected to be complete until April, 2020.

  1. Advanced nanocomposite scintillator for gamma radiation detection

    SBC: AGILTRON, INC.            Topic: DTRA08005

    Until now gamma radiation detection has required large single crystals of sensitive materials that are difficult to produce consistently on an industrial scale. In collaboration with a research group at the University of Texas at Arlington, Agiltron proposes to develop a new class of nanocomposite scintillator materials. The radiation detection characteristics of the synthetic nanoparticles in the ...

    SBIR Phase I 2008 Department of DefenseDefense Threat Reduction Agency
  2. Improvements in Scintillation Technology for Detection of Nuclear Radiation

    SBC: Radiation Monitoring Devices, Inc.            Topic: DTRA07004

    High-resolution scintillation crystals and crystal arrays are important components of current and future handheld and arrayed detectors (used for DOD/DTRA applications), and scintillation spectrometers (routinely used in high energy physics research, medical imaging, diffraction, homeland security, nuclear waste clean-up, nuclear treaty verification and safeguards, and geological exploration). Un ...

    SBIR Phase II 2008 Department of DefenseDefense Threat Reduction Agency
  3. SEE Modeling and Mitigation in Ultra-Deep Submicron Microelectronics

    SBC: Microelectronics Research Development Corporation            Topic: DTRA07005

    As technology feature sizes decrease, single event upset (SEU), digital single event transient (DSET), and multiple bit upset (MBU) effects dominate the radiation response of microcircuits. Recent test circuits and test methods have quantified the pulse widths of DSETs generated from heavy-ion strikes on critical microcircuit nodes. These pulse widths have proven to be much larger than previousl ...

    SBIR Phase II 2008 Department of DefenseDefense Threat Reduction Agency
  4. Engineered Substrates for “Zero-Penalty” Radiation Hardening of Ultra Deep Submicron Commercial Processes

    SBC: RADIATION ASSURED DEVICES, INC.            Topic: DTRA08003

    We have developed engineered epitaxial layers based on nanostructure technology that can potentially harden commercial silicon devices against radiation by minimizing collected photocurrents (electron-hole pairs) via recombination centers. Adding recombination centers in CMOS devices is a well-known technique for reducing the collected charge; however, attempts at manufacturing a device with this ...

    SBIR Phase I 2008 Department of DefenseDefense Threat Reduction Agency
  5. Batteryless Sensors for Intrusion Detection and Assessment of Threats

    SBC: Anro Engineering, Inc.            Topic: N/A

    A batteryless and wireless sensor for intrusion detection and assessment of threats which requires no battery, external power or wiring is proposed. These types of sensors derive energy from passing vehicles or persons, and indicate their presence, location, speed, etc., via a self-generated short-range radio signal. These sensors require no maintenance, and can be inconspicuously placed in window ...

    SBIR Phase II 1995 Department of DefenseDefense Threat Reduction Agency
  6. Eulerian Non-Reflecting Boundary for Structure-Bubble Interaction Involving Near Field Convention Explosions

    SBC: APTEK, Inc.            Topic: N/A

    CURRENT COROPUTER ANALYSIS OF BUBBLE-SUBMERGED STRUCTURE INTERACTION, DUE TO CONVENTIONAL WEAPONS, IS EXTREMELY RESOURCE INTENSIVE. THEREFORE, IT IS VERY DIFFICULT TO REPLACE FULL SCALE LIVE FIRE TESTING OF SUBMERGED STRUCTURE WITH SCALE TESTING OF SUBMERGED STRUCTURES AND COMPUTER ANALYSIS. THE GOAL OF THIS EFFORT IS TO DEVELOP AN ACCURATE AND EFFICIENT NON-REFLECTING BOUNDARY FOR EULERIAN HYDROD ...

    SBIR Phase I 1993 Department of DefenseDefense Threat Reduction Agency
  7. ION BEAM DEPOSITED FERROELECTRIC MEMORY FILMS

    SBC: EIC LABORATORIES, INC.            Topic: N/A

    COMPUTER MEMORY ARRAYS ARE EXTREMELY VULNERABLE TO ELECTROMAGNETIC DISTURBANCES RESULTING FROM ACCIDENTAL OR HOSTILE ACTIONS. HARDENING AGAINST SUCH EFFECTS CAN BE IMPARTED EITHER BY ADDING EXTERNAL PROTECTION TO EXISTING SYSTEMS OR BY INCORPORATING SURVIVABILITY IN NEW DESIGNS. INHERENT HARDNESS CAN BE IMPARTED TO RANDOM ACCESS MEMORY ARRAYS BY USING THIN FILM FERROELECTRIC MATERIALS AS MEMORY EL ...

    SBIR Phase II 1993 Department of DefenseDefense Threat Reduction Agency
  8. HIGH FREQUENCY AIRBLAST PRESSURE SENSOR FOR UGT MEASUREMENTS

    SBC: GEO-CENTERS, INC.            Topic: N/A

    CONVENTIONAL INSTRUMENTATION FOR AIRBLAST PRESSURE MEASUREMENTS IN CAVITY SHOTS IS LIMITED IN RISE TIME CAPABILITY. THIS RESULTS IN THE INSTRUMENTATION PROVIDING AN INCORRECT INDICATION OF PEAK PRESSURE, WHICH CREATES DISTORTION IN GENERATED HEIGHT-OF-BURST CURVES. THE DEVELOPMENT OF A FIBER OPTIC AIRBLAST PRESSURE SENSOR BASED ON THE PHOTOELASTIC EFFECT IS PROPOSED. THIS TECHNIQUE PROMISES TO PRO ...

    SBIR Phase II 1993 Department of DefenseDefense Threat Reduction Agency
  9. DEVELOPMENT OF A DEPTH PROFILING METHOD FOR USE WITH A TOTAL REFLECTANCE X-RAY FLOURESCENCE SYSTEM

    SBC: IBIS TECHNOLOGY CORP.            Topic: N/A

    SIMOX MATERIAL IS RAPIDLY BECOMING THE SOI MATERIAL OF CHOICE FOR MANY IC APPLICATIONS, INCLUDING RADIATION HARDENED. A CONSTANT THEME OF CONCERN THROUGHOUT THE DEVELOPMENT OF THIS TECHNOLOGY HAS BEEN THE METALLIC IMPURITY CONTENT IN THE MATERIAL. MAJOR EFFORTS HAVE ADDRESSED THE ELIMINATION OF THE METALLIC CONTAMINATION BY MODIFICATION OF THE IMPLANTATION EQUIPMENT USED TO FABRICATE SIMOX MATERIA ...

    SBIR Phase II 1993 Department of DefenseDefense Threat Reduction Agency
  10. Ultra-Low Pinhole Simox

    SBC: IBIS TECHNOLOGY CORP.            Topic: N/A

    A PROGRAM IS PROPOSED TO EVALUATE THE IMPACT OF CHANNELING OF OXYGEN ON BURIED OXIDE XNTEGRITY IN SIMOX MATERIAL. BURIED OXIDE PINHOLEDENSITY AND CRYSTALLOGRAPHIC ORIENTATION RELATED PATTERNS IN BURIED OXIDE PINHOLE MAPS WILL BE EXPLAINED DEPENDING UPON THE IMPLANT ANGLE. THE METHOD BASED ON THE ELECTROYTIC PLATING OF COPPER WILL BE USED TO OBTAIN THE MAPS OF PINHOLES. THIS WORK WILL IMPROVE KNOWL ...

    SBIR Phase I 1993 Department of DefenseDefense Threat Reduction Agency

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