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The Award database is continually updated throughout the year. As a result, data for FY20 is not expected to be complete until September, 2021.

  1. Defect Reduction at the Silicon (112) Wafer Surface by Amorphization and Recrystallization

    SBC: Amethyst Research Incorporated            Topic: MDA11T002

    Silicon wafers oriented on (112) are the preferred substrates for deposition of mercury cadmium telluride layers by molecular beam epitaxy. Surface defects introduced during polishing of the wafers degrade the quality of the epitaxy and the performance of infrared detectors fabricated within these materials. We propose a process for reducing the density of the defects that are inherent in the si ...

    STTR Phase I 2011 Department of DefenseMissile Defense Agency
  2. The Use of Hydrogen for Defect Reduction in Large Format Infrared Detector Materials

    SBC: Amethyst Research Incorporated            Topic: MDA11T002

    Active defects negatively impact the performance of IRFPAs by increasing noise at various levels up to, and including, catastrophic degradation. Evidence indicates that"killer defects"are related to the interaction of open core screw dislocations with impurities that remain after substrate preparation, prior to HgCdTe growth. This impurity diffusion creates a conducting channel that shorts the j ...

    STTR Phase I 2011 Department of DefenseMissile Defense Agency
  3. High Operability HgCdTe Focal Plane Arrays on Si by Mitigation of Defects

    SBC: Amethyst Research Incorporated            Topic: MDA11T002

    For HgCdTe infrared focal plane arrays fabricated on Si substrates, a model has recently been proposed to account for the disparity between the density of failed pixels and the density of dislocations that are present in the HgCdTe junction region. The model distinguishes between active and inactive dislocations and offers a hypothesis that dislocations are active only when they intersect particul ...

    STTR Phase I 2011 Department of DefenseMissile Defense Agency
  4. High-Speed Three-Channel Photonic Time Delay Unit

    SBC: AGILTRON, INC.            Topic: MDA08T012

    An innovative, super-miniature, fast-switching array-based photonic time delay device is being developed for the active electronically scanned-array (AESA) MDA and Navy radars. The design is based on the fast electro-optic effect, the super miniature fiber-lens collimation array, and the existing WDM photonic true time delay technologies. In Phase I Agiltron has successfully demonstrated the core ...

    STTR Phase II 2011 Department of DefenseMissile Defense Agency
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