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Award Data

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The Award database is continually updated throughout the year. As a result, data for FY24 is not expected to be complete until March, 2025.

Download all SBIR.gov award data either with award abstracts (290MB) or without award abstracts (65MB). A data dictionary and additional information is located on the Data Resource Page. Files are refreshed monthly.

The SBIR.gov award data files now contain the required fields to calculate award timeliness for individual awards or for an agency or branch. Additional information on calculating award timeliness is available on the Data Resource Page.

  1. Creating Resilient Structures with Polymer Coatings

    SBC: Optechnology, Inc.            Topic: 819S

    The first goal of our team is to design and develop highly cement mortar composites using novel patent applied for technology which has been shown to produce materials with high energy absorption, decreased modulus, higher tensile strength, and greater toughness than standard or ultra high performance concretes or fibercements. These materials will be used to produce NEMA Class 5 flood resistant ...

    SBIR Phase I 2009 Department of Commerce
  2. A Superior Lower-Cost Dual-Polarized MPAR Array Antenna

    SBC: FREENT TECHNOLOGIES, INC.            Topic: 833

    FreEnt proposes a next generation low cost, dual-polarization Ultra-Wide Band (UWB) Connected Array antenna for MPAR. The new array supports both weather surveillance and surveillance with pristine cross polarization performance. Key attributes are low cost COTS, complete frequency and waveform flexibility, and pristine polarization performance and isolation with the following benefits: • P ...

    SBIR Phase I 2009 Department of Commerce
  3. High Speed Imaging Spectropolarimeter for Dynamic Samples

    SBC: POLARIS SENSOR TECHNOLOGIES INC            Topic: 9020663R

    Spectroscopic ellipsometry is recognized as the gold standard in noncontact characterization of the refractive index and thickness of a thin optical film or film stack on a substrate. However, it suffers from a number of shortcomings, perhaps the most important of which is the time required to perform a single measurement. Moreover, manufacturers are interested in comprehensive evaluation of thin ...

    SBIR Phase I 2013 Department of CommerceNational Institute of Standards and Technology
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