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The Award database is continually updated throughout the year. As a result, data for FY21 is not expected to be complete until September, 2022.

Download all SBIR.gov award data either with award abstracts (290MB) or without award abstracts (65MB). A data dictionary and additional information is located on the Data Resource Page. Files are refreshed monthly.

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  • Record 1 TO 4

  1. Novel Methods to Measure Penetrator Dynamics in Multi-Layer Geometries

    SBC: Thornton Tomasetti, Inc.            Topic: DTRA07011

    In Phase I of this effort we analyzed the structural response of a BLU 109 during typical penetration events. Based on these finite element results, we proposed and demsonstrated a simple robust concept for a passive penetrator sensor that identifies the material being penetrated and also correlates strongly with its underground trajectory. Such a sensor would obviously provide valuable informatio ...

    SBIR Phase II 2008 Department of DefenseDefense Threat Reduction Agency

  2. The Characterization and Mitigation of Single Event Effects in Ultra-Deep Submicron (< 90nm) Microelectronics

    SBC: Orora Design Technologies, Inc.            Topic: DTRA07005

    Orora Design Technologies proposes to develop electronic design automation (EDA) tools employing minimally invasive circuit design-based methods to mitigate single event effects (SEEs) for next generation Ultra-DSM CMOS (

    SBIR Phase II 2008 Department of DefenseDefense Threat Reduction Agency

  3. Advanced Technologies for Discrete-Parts Manufacturing

    SBC: Modumetal, Inc.            Topic: DLA07001

    The purpose of this SBIR effort is to commercialize an innovative method for the production of Modumetal™ discrete parts. The Phase I effort has demonstrated: (1) The low-cost production of monolithic parts of various scales using a net-shape (additive) manufacturing process, (2) An new production process in which cost and production volume are decoupled, and (3) Significant improvement in pr ...

    SBIR Phase II 2008 Department of DefenseDefense Logistics Agency

  4. High Power Single Frequency Source for Cavity Ring-Down Spectroscopy

    SBC: Aculight Corporation            Topic: N/A

    NIST is using a sensitive optical technique called cavity ring-down detection to permit detection of impurities in semiconductor process gases, which cause substantial losses in manufacturing yield. In order to increase the sensitivity and range of application of this technique, improved single frequency laser sources are required. In particular, lasers providing more power, narrower line-width, b ...

    SBIR Phase II 2004 Department of CommerceNational Institute of Standards and Technology
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