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The Award database is continually updated throughout the year. As a result, data for FY20 is not expected to be complete until September, 2021.

  1. Characterization and Mitigation of Radiation Effects in Quantum Dot Based Nanotechnologies

    SBC: CFD Research Corporation            Topic: DTRA082001

    For applications in DoD satellite systems, devices based on novel nanomaterials offer significant advantages over traditional technologies in terms of light-weight and efficiency. Examples of such novel devices include quantum dot (QD) based solar cells, photodetectors, radars and sensors. However, the response of these devices to radiation effects is not well understood, and radiation effects mod ...

    SBIR Phase II 2010 Department of DefenseDefense Threat Reduction Agency
  2. Characterization and Mitigation of Radiation Effects in Nonplanar Nano-technology Microelectronics

    SBC: CFD Research Corporation            Topic: DTRA092001

    Future high-performance integrated circuits in DoD satellite systems will require non-planar nano-technology devices, such as MultiGate Field Effect Transistors (MuGFET) or FinFET, which can decrease pattern area of logic circuits below 50% of the conventional planar technologies. The International Technology Roadmap for Semiconductors predicts that such devices will be the cornerstone of sub-32nm ...

    SBIR Phase I 2010 Department of DefenseDefense Threat Reduction Agency
  3. An Integrated, Electrokinetics-Augmented Microfluidic Device for Forensic DNA Analysis

    SBC: CFD Research Corporation            Topic: DTRA092003

    The use of WMDs and IEDs by covert insurgents and terrorists poses a significant risk to U.S. military forces and civilians. The capability to execute rapid forensic DNA analysis to identify individuals who manufactured and transported these threatening devices is of paramount importance to military mission, homeland security and civilian safety. Current DNA forensic analyses are time-consuming, b ...

    SBIR Phase I 2010 Department of DefenseDefense Threat Reduction Agency
  4. Electrokinetic-based Microfluidic Universal Sample-Preparation (EMUS) Platform

    SBC: CFD Research Corporation            Topic: DTRA092002

    Sample preparation has been recognized as the single most important challenge to be faced in the development of detect-to-warn (DTW) systems. Available commercial sample preparation technologies are expensive, slow, and require trained laboratory technicians and sophisticated laboratory equipment for operation. Addressing this need, we propose to design, fabricate, and demonstrate a general purpos ...

    SBIR Phase I 2010 Department of DefenseDefense Threat Reduction Agency
  5. Next Generation Blast Simulation

    SBC: Reaction Engineering International            Topic: DTRA092015

    With the current state of world events, the threat of explosives used against high-value targets is more pronounced than ever before. As a result, simulation of blast events and their effects on structures has become an increasingly vital capability. Current blast simulations on Central Processing Units (CPU) resources require a significant amount of computational time, limiting their overall valu ...

    SBIR Phase I 2010 Department of DefenseDefense Threat Reduction Agency
  6. Weapon Payloads for Bulk Chemical and Biological Agent Neutralization

    SBC: Integrated Solutions for Systems, Inc.            Topic: DTRA092012

    Current offensive solutions to neutralize chem/bio agent facilities rely on blast and/or short-burst high-temperature neutralization but have the potential to produce severe collateral damage via agent release. Our team proposes the Dispersed Energetics Coupled for Optimized Neutralization (DECON) Concept, an alternative concept to perform bulk neutralization of agents. The DECON concept can be s ...

    SBIR Phase I 2010 Department of DefenseDefense Threat Reduction Agency
  7. Characterization and Mitigation of Radiation Effects in High-Speed Compound Semiconductor Microelectronics

    SBC: CFD Research Corporation            Topic: DTRA08003

    For ultra high speed applications in DoD satellite systems, devices and circuits fabricated from III–V semiconductor compounds offer significant advantages over silicon-based technology in terms of operating speed and power. However, the uncertainty in single-event-effect (SEE) response of compound technologies forces the use of empirically-based hardening techniques with penalties in increased ...

    SBIR Phase I 2008 Department of DefenseDefense Threat Reduction Agency
  8. Engineered Substrates for “Zero-Penalty” Radiation Hardening of Ultra Deep Submicron Commercial Processes

    SBC: RADIATION ASSURED DEVICES, INC.            Topic: DTRA08003

    We have developed engineered epitaxial layers based on nanostructure technology that can potentially harden commercial silicon devices against radiation by minimizing collected photocurrents (electron-hole pairs) via recombination centers. Adding recombination centers in CMOS devices is a well-known technique for reducing the collected charge; however, attempts at manufacturing a device with this ...

    SBIR Phase I 2008 Department of DefenseDefense Threat Reduction Agency
  9. Agent Defeat using Proton Accelerator

    SBC: UES, Inc.            Topic: DTRA08008

    The objective of this program is to develop a capability for a field deployable proton accelerator system that can generate high energy protons to neutralize concentrated masses of bio-agents held in steel storage drums. The Phase I research and development will involve conceptual design of a compact field deployable proton accelerator capable of delivering protons of energy >100 MeV, and studying ...

    SBIR Phase I 2008 Department of DefenseDefense Threat Reduction Agency
  10. SEE Modeling and Mitigation in Ultra-Deep Submicron Microelectronics

    SBC: MICROELECTRONICS RESEARCH DEVELOPMENT CORPORATION            Topic: DTRA07005

    As technology feature sizes decrease, single event upset (SEU), digital single event transient (DSET), and multiple bit upset (MBU) effects dominate the radiation response of microcircuits. Recent test circuits and test methods have quantified the pulse widths of DSETs generated from heavy-ion strikes on critical microcircuit nodes. These pulse widths have proven to be much larger than previousl ...

    SBIR Phase II 2008 Department of DefenseDefense Threat Reduction Agency
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