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The Award database is continually updated throughout the year. As a result, data for FY19 is not expected to be complete until April, 2020.

  1. An Automated Lapping Apparatus and Process for High-Precision Random Profile Roughness Specimen Fabrication

    SBC: X-Wave Innovations, Inc.            Topic: 9020268TT

    The measurement and quality control for smooth engineering surfaces are becoming more and more important in modern science and technology due to their important engineering functions and high production costs. NIST has frequently received requests from U.S. industry to provide Standard Reference Material (SRM) high-precision, random profile roughness specimens to support smooth surface measurement ...

    SBIR Phase II 2013 Department of CommerceNational Institute of Standards and Technology

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