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Award Data

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The Award database is continually updated throughout the year. As a result, data for FY24 is not expected to be complete until March, 2025.

Download all SBIR.gov award data either with award abstracts (290MB) or without award abstracts (65MB). A data dictionary and additional information is located on the Data Resource Page. Files are refreshed monthly.

The SBIR.gov award data files now contain the required fields to calculate award timeliness for individual awards or for an agency or branch. Additional information on calculating award timeliness is available on the Data Resource Page.

  1. XpressRules-PM: Commercial Implementation of PM/NGAC

    SBC: XpressRules LLC            Topic: NA

    This proposal represents a collaborative response by XpressRules and NIST to a two-fold demand from the information security marketplace. The business requirement (for true policy governance) is that asset owners and steward themselves-and not IT—become directly accountable for the life cycles of their rules and policies. The technical requirement (for an adequate data model) is that the policie ...

    SBIR Phase I 2017 Department of CommerceNational Institute of Standards and Technology
  2. 3-D Digital Image Correlation Based Non-Destructive Testing System for Qualification of Additive Manufacturing Parts

    SBC: X-Wave Innovations, Inc.            Topic: NA

    NIST's seeks a high resolution DIC technology for qualification of complex AM parts. To meet this critical need, X-wave Innovations Inc. proposes to develop a 3-Dimentional Digital Image Correlation (3-D DIC) based NDT system. The proposed effort builds upon the success of XII in developing a variety of NDT technologies (including DIC system) for advanced materials evaluation. The success of the p ...

    SBIR Phase I 2017 Department of CommerceNational Institute of Standards and Technology
  3. Absolute Distance Interferometer for Manufacturing Metrology Applications

    SBC: Bridger Photonics, Inc.            Topic: NA

    Bridger Photonics, Inc. proposes to develop an absolute length metrology sensor that will simultaneously provide >1,000 measurements per second, 0.5 m maximum measurement distance. Bridger’s solution is will fill a gap in precision measurement technology for applications that require rapid monitoring of macroscopic distances such as positioning and calibration of surface metrology systems (CMM, ...

    SBIR Phase II 2017 Department of CommerceNational Institute of Standards and Technology
  4. N/A

    SBC: Dokken Software, Incorporated            Topic: N/A

    N/A

    SBIR Phase I 2000 Department of Commerce
  5. N/A

    SBC: Epitaxial Technologies, LLC            Topic: N/A

    N/A

    SBIR Phase I 2000 Department of Commerce
  6. Innovative Manufacturing Methods for Diamond Indenters

    SBC: Gilmore Diamond Tools, Inc.            Topic: N/A

    N/A

    SBIR Phase II 2000 Department of Commerce
  7. N/A

    SBC: GMA INDUSTRIES, INC.            Topic: N/A

    N/A

    SBIR Phase I 2000 Department of DefenseOffice of the Secretary of Defense
  8. N/A

    SBC: Hy-Tek, Ltd.            Topic: N/A

    N/A

    SBIR Phase I 2000 Department of Commerce
  9. High Resolution, 3-D, Digital Image Calibration System for Brachytherapy Sources

    SBC: Industrial Quality, Inc.            Topic: N/A

    N/A

    SBIR Phase II 2000 Department of Commerce
  10. N/A

    SBC: INSIGHTFUL CORPORATION            Topic: N/A

    N/A

    SBIR Phase I 2000 Department of Commerce
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