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Award Data

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The Award database is continually updated throughout the year. As a result, data for FY20 is not expected to be complete until September, 2021.

  1. 3-D Digital Image Correlation Based Non-Destructive Testing System for Qualification of Additive Manufacturing Parts

    SBC: X-Wave Innovations, Inc.            Topic: NA

    NIST's seeks a high resolution DIC technology for qualification of complex AM parts. To meet this critical need, X-wave Innovations Inc. proposes to develop a 3-Dimentional Digital Image Correlation (3-D DIC) based NDT system. The proposed effort builds upon the success of XII in developing a variety of NDT technologies (including DIC system) for advanced materials evaluation. The success of the p ...

    SBIR Phase I 2017 Department of CommerceNational Institute of Standards and Technology
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