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Award Data

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The Award database is continually updated throughout the year. As a result, data for FY20 is not expected to be complete until September, 2021.

  1. An Optical Imaging System to Characterize Mechanical Deformation at Microscopic Length Scale

    SBC: Additive Manufacturing Innovations LLC            Topic: 90

    Additive Manufacturing Innovations LLC (AM-Innov) in collaboration with Clarkson University and Naval Research Laboratory (NRL) proposes a new optical imaging system to characterize microscopic deformation of materials. The system, named as a Mechanical Testing at Microscale system (MT@micro), uses a micro-tensile testing device to mechanically load the specimen uniaxially and an optical imaging p ...

    SBIR Phase I 2020 Department of CommerceNational Institute of Standards and Technology
  2. Standardizing Grease Sampling and Characterization By Automated Online Device

    SBC: Poseidon Systems, LLC            Topic: 90

    Scheduled grease sampling is one of the more reliable methods for detecting mechanical issues within machinery. Offline laboratory‐based analysis of the grease can indicate component failures, such as spalling via high concentrations of ferrous particulates. However, consistency, costs, and frequency of sampling are less than ideal. Manually collecting grease samples can put personnel in danger ...

    SBIR Phase I 2020 Department of CommerceNational Institute of Standards and Technology
  3. High Throughput, High-Pressure Small-Angle Neutron Scattering Sample Environment

    SBC: STF Technologies LLC            Topic: 90

    We address a need of the neutron user community by creating a minimum viable prototype of the only high-throughput hydrostatic pressure small angle neutron scattering sample environment (HTHP-SANS-SE). Our HTHP-SANS-SE will greatly improve the ease of use and reliability of measurements under extreme environments, thereby increasing throughput on the beamline and expanding feasibility. Current HP- ...

    SBIR Phase I 2020 Department of CommerceNational Institute of Standards and Technology
  4. Watertight CAD for Integrating Isogeometric Analysis into the Model-Based Enterprise

    SBC: Nvariate, Inc.            Topic: 90

    Today’s Computer-Aided Design (CAD) applications utilize restrictive mathematical assumptions to approximate the compound geometric intersections necessary to represent real-world products. As a result, critical information is not represented within the Model-Based Definition (MBD) for downstream users in the digital thread, forcing engineers to manually repair CAD models and convert them into d ...

    SBIR Phase II 2020 Department of CommerceNational Institute of Standards and Technology
  5. Advanced Manufacturing and Material Measurements Software Tool WEAVE for the Accelerating and Automation of SEM image analysis in the Semiconductor Industry

    SBC: Sandbox Semiconductor Incorporated            Topic: 90

    The goal of this proposal is to create the software Weave™ to automate the extraction of critical dimensions (CDs) from scanning electron microscope (SEM) images for the microelectronics industry. Current best practices for extraction of CDs are that personnel analyze the images one by one, which is tedious, prone to human bias, time-consuming and expensive. Successful implementation of Weave™ ...

    SBIR Phase II 2020 Department of CommerceNational Institute of Standards and Technology
  6. Advanced Manufacturing and Material Measurements Software Tool Weave ™ for the Acceleration and Automation of SEM Image Analysis in the Semiconductor Industry

    SBC: Sandbox Semiconductor Incorporated            Topic: None

    In this Phase I SBIR proposal, SandBox Semiconductor™ proposes to develop an Advanced Manufacturing and Material Measurements software tool called Weave ™ for accelerating and automating SEM image analysis for the semiconductor industry. During the development of a new manufacturing process line for a semiconductor device, tens of thousands of scanning electron microscopy (SEM) images are take ...

    SBIR Phase I 2019 Department of CommerceNational Institute of Standards and Technology
  7. Nanomachine Device for Semiconductor Process Control Monitoring

    SBC: Xallent LLC            Topic: None

    Conventional characterization and test methods are increasingly ineffective when applied to structures less than 100 nanometers, causing challenges across R&D, process control and failure analysis. An increasing number of subtle defects become prominent drivers of failure as device size and operating margins decrease, e.g., processing anomalies in thin gate oxides, substrate problems related to do ...

    SBIR Phase I 2019 Department of CommerceNational Institute of Standards and Technology
  8. Gap-Free Model-Based Engineering for Manufacturing and Analysis: Digital Thread without Translation

    SBC: Nvariate, Inc.            Topic: None

    Modern Model-Based Enterprise / Engineering (MBE) systems rely on freeform surfaces built as complex combinations of geometric primitives to define engineered objects. Unfortunately, the intersection of freeform surfaces in MBE applications results in highly approximated solutions, degrading models that cost billions annually by US industry to fix. Current technology limits the abilities of users ...

    SBIR Phase I 2019 Department of CommerceNational Institute of Standards and Technology
  9. Multimode Chiroptical Spectrometer for Nanoparticle Characterization

    SBC: Applied Nanofluorescence LLC            Topic: None

    This project will develop a new scientific instrument optimized for the advanced characterization of near-infrared fluorescent nanoparticles that can exist as left- or right-handed structures (enantiomers). Single-walled carbon nanotubes (SWCNTs) are the leading current example of such nanomaterials. Applied NanoFluorescence, LLC (ANF) proposes a novel multi-mode chiroptical spectrometer that can ...

    SBIR Phase II 2019 Department of CommerceNational Institute of Standards and Technology
  10. IF Conversion System for High-Bandwidth Multiplexed Sensors Arrays

    SBC: Alphacore, Inc.            Topic: None

    Alphacore will develop an Intermediate Frequency (IF) Conversion System for High-Bandwidth Multiplexed Sensors Arrays for Phase II of NIST's 2018 soliciation for Exploratory Measurement Science Topic 9.04.02.68.The proposing team has already successfully developed and evaluated a prototype board in Phase I.The goal in Phase II is therefore to achieve three primary objectives:1) Optimize the design ...

    SBIR Phase II 2019 Department of CommerceNational Institute of Standards and Technology
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