Award Data

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The Award database is continually updated throughout the year. As a result, data for FY19 is not expected to be complete until September, 2020.

  1. SCAP Content Editor

    SBC: G2, INC.            Topic: N/A

    NIST and G2 have been on the forefront of security automation with the development of the Security Content Automation Protocol (SCAP). However, the barrier to entry for SCAP content creation is the requirement to have in depth knowledge of the underlying specifications. This project aims to allow security experts to create SCAP content without the need to be an expert in the specification. By leve ...

    SBIR Phase II 2012 Department of CommerceNational Institute of Standards and Technology
  2. Anion Exchange Resin for Chirality-based Separation of Single-wall Carbon Nanotubes

    SBC: Sepax Technologies, Inc.            Topic: N/A

    Sepax Technologies, Inc. has identified a new type of anoin-exchange resin which separates single-wall carbon nanotubes (SWCNTs) with >80% recovery yield and resolves in a single pass the chiral tubes of (6,5) well from commercial SWCNT starting materials by Chromatography. Improvement and scale up of the targeted resin production will facilitate the separation of chiral nanotubes for the academic ...

    SBIR Phase II 2012 Department of CommerceNational Institute of Standards and Technology
  3. Fulcrum Biometrics' Plan for Research and Development of WS-BD Conformant Handheld Fingerprint Sensor

    SBC: Fulcrum Biometrics, LLC            Topic: N/A

    Trusted biometric validation of individual identities has never been more important. Several contributing factors are the increase in global terrorism, identity theft and the increase in legislation which are driving the accelerated adoption of biometric technology. Unfortunately, the biometrics industry has not actively responded to the changing market conditions being driven by the explosion in ...

    SBIR Phase I 2012 Department of CommerceNational Institute of Standards and Technology
  4. An Automated Lapping Apparatus and Process for High- Process for High-Precision Random Profile Roughness Specimen Fabrication

    SBC: X-Wave Innovations, Inc.            Topic: N/A

    The measurement and quality control for smooth engineering surfaces are becoming more and more important in modern science and technology due to their important engineering functions and high production costs. NIST has frequently received requests for U.S. industry to provide Standard Reference Material (SRM) high-precision, random profile roughness specimens to support smooth surface measurements ...

    SBIR Phase I 2012 Department of CommerceNational Institute of Standards and Technology
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