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Award Data

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The Award database is continually updated throughout the year. As a result, data for FY24 is not expected to be complete until March, 2025.

Download all SBIR.gov award data either with award abstracts (290MB) or without award abstracts (65MB). A data dictionary and additional information is located on the Data Resource Page. Files are refreshed monthly.

The SBIR.gov award data files now contain the required fields to calculate award timeliness for individual awards or for an agency or branch. Additional information on calculating award timeliness is available on the Data Resource Page.

  1. Dynamic Frequency Passive Millimeter-Wave Radiometer Based on Optical Up-Conversion

    SBC: PHASE SENSITIVE INNOVATIONS INC            Topic: 941D

    In the proposed effort, we will leverage this extensive experience and capabilities to realize a frequency agile mmW radiometer that can cover the range of DC-110 GHz and can be scaled to DC-200 GHz under Phase II. Ours is a photonic system that multiplies and up-coverts a low-frequency reference signal onto an optical carrier (laser) using EO modulation, then uses the modulation sidebands to inj ...

    SBIR Phase I 2013 Department of CommerceNational Oceanic and Atmospheric Administration
  2. Automated SCAP Tool Validator (ASTV)

    SBC: ATC-NY INC            Topic: 9010377R

    The current testing methods of the NIST Security Content Automation Protocol (SCAP) Validation Program are largely manual and labor-intensive, making comprehensive validation of SCAP-enabled IT security products difficult and time-consuming. ATC-NY will design and develop the Automated SCAP Tool Validator (ASTV) for use with the SCAP Public Validation Test Suite and others. ASTV automates the conf ...

    SBIR Phase I 2013 Department of CommerceNational Institute of Standards and Technology
  3. High Speed Imaging Spectropolarimeter for Dynamic Samples

    SBC: POLARIS SENSOR TECHNOLOGIES INC            Topic: 9020663R

    Spectroscopic ellipsometry is recognized as the gold standard in noncontact characterization of the refractive index and thickness of a thin optical film or film stack on a substrate. However, it suffers from a number of shortcomings, perhaps the most important of which is the time required to perform a single measurement. Moreover, manufacturers are interested in comprehensive evaluation of thin ...

    SBIR Phase I 2013 Department of CommerceNational Institute of Standards and Technology
  4. Credential Management

    SBC: ECleide (VKD Shoppe, Inc.)            Topic: N/A

    The ability to electronically identify users and their devices is increasingly becoming an integral part of our interaction with computing platforms. Whether an operating system is contacting the manufacturer's web site to confirm its proper registration and payment today, or a cell phone is broadcasting entrance credentials to a secure physical site tomorrow, it is apparent that identifying infor ...

    SBIR Phase I 2004 Department of CommerceNational Institute of Standards and Technology
  5. Ontology based Computational Tools for Distributed CAD

    SBC: Lateral Eye, Inc.            Topic: N/A

    CAD CAM technologies have had an immense impact on the product development process in the last two decades. Current technologies, however, have limited knowledge representation and computational capabilities to enable collaboration of design decisions beyond commercial Internet based collaboration tools. In the Phase 1 Lateral Eye proposes to develop a new framework for Knowledge Integrated comput ...

    SBIR Phase I 2004 Department of CommerceNational Institute of Standards and Technology
  6. Next-generation Simulation Suite for Advanced Optical Metrology

    SBC: RSOFT DESIGN GROUP            Topic: N/A

    This proposal is aimed at developing a full software solution for the next generation advanced optical metrology. Existing simulation tools cannot meet the current and future needs of scattering-based optical metrology for semiconductor manufacturing. Our proposed work will first focus on developing an enhanced RCWA-based simulation engine with advanced algorithms for fast convergence and stabilit ...

    SBIR Phase I 2004 Department of CommerceNational Institute of Standards and Technology
  7. Anion Exchange Resin for Chirality-based Separation of Single-wall Carbon Nanotubes

    SBC: Sepax Technologies, Inc.            Topic: N/A

    Sepax Technologies, Inc. has identified a new type of anoin-exchange resin which separates single-wall carbon nanotubes (SWCNTs) with >80% recovery yield and resolves in a single pass the chiral tubes of (6,5) well from commercial SWCNT starting materials by Chromatography. Improvement and scale up of the targeted resin production will facilitate the separation of chiral nanotubes for the academic ...

    SBIR Phase II 2012 Department of CommerceNational Institute of Standards and Technology
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