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Award Data

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The Award database is continually updated throughout the year. As a result, data for FY24 is not expected to be complete until March, 2025.

Download all SBIR.gov award data either with award abstracts (290MB) or without award abstracts (65MB). A data dictionary and additional information is located on the Data Resource Page. Files are refreshed monthly.

The SBIR.gov award data files now contain the required fields to calculate award timeliness for individual awards or for an agency or branch. Additional information on calculating award timeliness is available on the Data Resource Page.

  1. Anion Exchange Resin for Chirality-based Separation of Single-wall Carbon Nanotubes

    SBC: Sepax Technologies, Inc.            Topic: N/A

    Sepax Technologies, Inc. has identified a new type of anoin-exchange resin which separates single-wall carbon nanotubes (SWCNTs) with >80% recovery yield and resolves in a single pass the chiral tubes of (6,5) well from commercial SWCNT starting materials by Chromatography. Improvement and scale up of the targeted resin production will facilitate the separation of chiral nanotubes for the academic ...

    SBIR Phase II 2012 Department of CommerceNational Institute of Standards and Technology
  2. Irradiated Environmental Chambers

    SBC: MEASUREMENT ANALYSIS CORPORATION            Topic: N/A

    Using a novel concept for humidity control, based on a proprietary saturated air source, MAC will construct and evaluate a prototype of an environmental chamber for use with NIST’s SPHERE UV source, in weathering or other UV degradation studies. The chamber will interface to the exit ports of the SPHERE, maintaining the material coupons, mounted in a standardized sample holder, at a programmed t ...

    SBIR Phase II 2012 Department of CommerceNational Institute of Standards and Technology
  3. A Compact, Tamper-Resistant, Portable Fingerprint Scanner

    SBC: SBG Labs            Topic: N/A

    With the growing demand for more efficient fingerprinting techniques, live scans are rapidly displacing traditional ink-based methods. Despite improvements in detector and processing technology for capturing and digitizing fingerprints, current equipment falls well short of NIST’s goal of a small, tamper-resistant, battery-powered, handheld scanner. Incumbent equipment suppliers have little comm ...

    SBIR Phase I 2012 Department of CommerceNational Institute of Standards and Technology
  4. Optimized X-ray Microscope (OXM) for IC Reverse Engineering

    SBC: Xradia            Topic: DMEA122001

    Nondestructive 3D imaging of the interconnect structure of microelectronics with x-rays has been demonstrated on an Xradia microscope at the synchrotron. The same scanning speed can be obtained in a non-synchrotron optimized x-ray microscope (OXM) by taking advantage of recent advancement in x-ray source and x-ray optics technology to be developed in the proposed project. The OXM will allow nondes ...

    SBIR Phase I 2012 Department of DefenseDefense Microelectronics Activity
  5. High Speed, High Resolution X-ray System for Inspecting Integrated Circuits

    SBC: DLA INSTRUMENTS CORPORATION            Topic: DMEA122001

    A new type of x-ray microscope is proposed for three-dimensional imaging of integrated circuits, or IC"s. The new microscope can image at resolutions down to 25 nm, and at speeds of over 10 million pixels per second. This imaging rate is over 1000x faster than existing high-resolution x-ray systems, and can image a full 1 cm chip in a few hours; existing x-ray microscopes would take years to accom ...

    SBIR Phase I 2012 Department of DefenseDefense Microelectronics Activity
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