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The Award database is continually updated throughout the year. As a result, data for FY19 is not expected to be complete until April, 2020.

  1. Direct Performance Evaluation of Additive Manufacturing Process Plans

    SBC: INTACT SOLUTIONS INC.            Topic: None

    Additive manufacturing is steadily advancing towards fulfilling its promise of customized and on-demand production of functional parts. However, performance of as-manufactured parts can differ significantly from the as-designed parts because the as-manufactured geometry differs from the as-designed geometry and the asmanufactured material properties are not known. Attempts to predict performance o ...

    SBIR Phase I 2019 Department of CommerceNational Institute of Standards and Technology
  2. Nanomachine Device for Semiconductor Process Control Monitoring

    SBC: Xallent LLC            Topic: None

    Conventional characterization and test methods are increasingly ineffective when applied to structures less than 100 nanometers, causing challenges across R&D, process control and failure analysis. An increasing number of subtle defects become prominent drivers of failure as device size and operating margins decrease, e.g., processing anomalies in thin gate oxides, substrate problems related to do ...

    SBIR Phase I 2019 Department of CommerceNational Institute of Standards and Technology
  3. Continuous Learning for Additive Manufacturing Processes Through Advanced Data Analytics

    SBC: Senvol LLC            Topic: NA

    Additive manufacturing (AM) is a promising manufacturing technique for end-use parts that can solve challenges for American manufacturers in many industries, e.g. aerospace, defense, automotive, energy, and healthcare. However, despite the potential that AM offers, the rate of AM adoption in industry is very slow. This is because AM suffers from low repeatability and quality consistency issues, wh ...

    SBIR Phase I 2018 Department of CommerceNational Institute of Standards and Technology
  4. High Temperature High Resolution in-situ Differential Pressure Sensor

    SBC: Innoveering, LLC            Topic: NA

    Chemical manufacturers require high accuracy/high sensitivity pressure sensors to efficiently monitor the various manufacturing systems and processes in the chemical plant, to ensure any changes proceed in a safe and reliable manner, adhering to expected standards and practices. NIST also has a need for highly accurate pressure measurements, especially determining the thermo-physical properties of ...

    SBIR Phase II 2017 Department of CommerceNational Institute of Standards and Technology
  5. High Temperature High Resolution in-situ Differential Pressure Sensor

    SBC: Innoveering, LLC            Topic: 90105

    Chemical manufacturers require high accuracy and high sensitivity pressure sensors to efficiently monitor the various manufacturing systems and processes in the chemical plant, to ensure any changes proceed in a safe and reliable manner, adhering to expected standards and practices. In addition, NIST has a need for highly accurate absolute and differential pressure measurements, especially for det ...

    SBIR Phase I 2016 Department of CommerceNational Institute of Standards and Technology
  6. A Tool for Building Semantically Interoperable Specification and Standards

    SBC: XSB INC.            Topic: 9010273R

    Standards and specifications are widely used in government and industry to define requirements for products and processes and insure interoperability, safety, and quality of industrial and domestic products. Specifications and standards documents almost always cross-reference other standards and specification. Taken together, the web of interdependent standards forms an immensely important knowled ...

    SBIR Phase I 2015 Department of CommerceNational Institute of Standards and Technology
  7. Production of NIST/UCSF Breast Phantom for Magnetic Resonance Imagaing (MRI)

    SBC: Phantom Laboratory            Topic: N/A

    his project involves the commercialization of the breast phantom designed by NIST and University of California, San Francisco (UCSF) for quantitative magnetic resonance imaging (MRI). The breast phantom consists of two independent phantoms, one focused on diffusion MRI measurements and the other focused on accurate measurements of fat and fibroglandular tissue properties. The proposed phantom is o ...

    SBIR Phase I 2014 Department of CommerceNational Institute of Standards and Technology
  8. Query-Based Interoperability for Simulation of Composite Structures

    SBC: INTACT SOLUTIONS INC.            Topic: 9020673R

    We propose to design and implement a query-based approach to interoperable modeling and simulation of composite material structures, that usually contain the manufacturing recipe within their design. In Phase I, we established the feasibility of the approach using a demonstration scenario of CAD/CAE interoperability for assemblies. In Phase II, we propose to develop a series of use-case scenarios ...

    SBIR Phase II 2013 Department of CommerceNational Institute of Standards and Technology
  9. Automated SCAP Tool Validator (ASTV)

    SBC: ATC-NY, Inc.            Topic: 9010377R

    The current testing methods of the NIST Security Content Automation Protocol (SCAP) Validation Program are largely manual and labor-intensive, making comprehensive validation of SCAP-enabled IT security products difficult and time-consuming. ATC-NY will design and develop the Automated SCAP Tool Validator (ASTV) for use with the SCAP Public Validation Test Suite and others. ASTV automates the conf ...

    SBIR Phase I 2013 Department of CommerceNational Institute of Standards and Technology
  10. High Speed Imaging Spectropolarimeter for Dynamic Samples

    SBC: Polaris Sensor Technologies, Inc.            Topic: 9020663R

    Spectroscopic ellipsometry is recognized as the gold standard in noncontact characterization of the refractive index and thickness of a thin optical film or film stack on a substrate. However, it suffers from a number of shortcomings, perhaps the most important of which is the time required to perform a single measurement. Moreover, manufacturers are interested in comprehensive evaluation of thin ...

    SBIR Phase I 2013 Department of CommerceNational Institute of Standards and Technology

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