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Award Data
The Award database is continually updated throughout the year. As a result, data for FY24 is not expected to be complete until March, 2025.
Download all SBIR.gov award data either with award abstracts (290MB)
or without award abstracts (65MB).
A data dictionary and additional information is located on the Data Resource Page. Files are refreshed monthly.
The SBIR.gov award data files now contain the required fields to calculate award timeliness for individual awards or for an agency or branch. Additional information on calculating award timeliness is available on the Data Resource Page.
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IF Conversion System for High-Bandwidth Multiplexed Sensors Arrays
SBC: ALPHACORE INC Topic: NoneAlphacore will develop an Intermediate Frequency (IF) Conversion System for High-Bandwidth Multiplexed Sensors Arrays for Phase II of NIST's 2018 soliciation for Exploratory Measurement Science Topic 9.04.02.68.The proposing team has already successfully developed and evaluated a prototype board in Phase I.The goal in Phase II is therefore to achieve three primary objectives:1) Optimize the design ...
SBIR Phase II 2019 Department of CommerceNational Institute of Standards and Technology -
Direct Performance Evaluation of Additive Manufacturing Process Plans
SBC: INTACT SOLUTIONS, INC Topic: NoneAdditive manufacturing is steadily advancing towards fulfilling its promise of customized and on-demand production of functional parts. However, performance of as-manufactured parts can differ significantly from the as-designed parts because the as-manufactured geometry differs from the as-designed geometry and the asmanufactured material properties are not known. Attempts to predict performance o ...
SBIR Phase I 2019 Department of CommerceNational Institute of Standards and Technology -
Nanomachine Device for Semiconductor Process Control Monitoring
SBC: XALLENT INC. Topic: NoneConventional characterization and test methods are increasingly ineffective when applied to structures less than 100 nanometers, causing challenges across R&D, process control and failure analysis. An increasing number of subtle defects become prominent drivers of failure as device size and operating margins decrease, e.g., processing anomalies in thin gate oxides, substrate problems related to do ...
SBIR Phase I 2019 Department of CommerceNational Institute of Standards and Technology -
FEOL & BEOL PARTITIONING
SBC: ALPHACORE INC Topic: DMEA182002Alphacore proposes Dr. Yago Gonzalez-Velo as the principal investigator (PI) for this SBIR program. Dr. Gonzalez-Velo has experience ranging from radiation effects, characterization to implementation of novel technologies in the BEOL of CMOS circuits. Dr Gonzalez Velo has gained experience in BEOL layer design, as well as photolithography mask design, and MEMS manufacturing experience through dif ...
SBIR Phase I 2019 Department of DefenseDefense Microelectronics Activity -
Through-Lens Fiducial Marking System
SBC: INFRARED LABORATORIES INC Topic: DMEA172002Through-lens laser fiducial marking systems can greatly increase throughput of semiconductor Failure Analysis (FA) labs, that do not have access to CAD drawings of the devices they are trying to analyze. Creating fiducial marks at points of interest on a semiconductor device allows the device to move and be analyzed by different FA equipment easily and quickly. In Phase I, a suitable laser was ...
SBIR Phase II 2019 Department of DefenseDefense Microelectronics Activity