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Award Data
The Award database is continually updated throughout the year. As a result, data for FY24 is not expected to be complete until March, 2025.
Download all SBIR.gov award data either with award abstracts (290MB)
or without award abstracts (65MB).
A data dictionary and additional information is located on the Data Resource Page. Files are refreshed monthly.
The SBIR.gov award data files now contain the required fields to calculate award timeliness for individual awards or for an agency or branch. Additional information on calculating award timeliness is available on the Data Resource Page.
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Credential Management
SBC: ECleide (VKD Shoppe, Inc.) Topic: N/AThe ability to electronically identify users and their devices is increasingly becoming an integral part of our interaction with computing platforms. Whether an operating system is contacting the manufacturer's web site to confirm its proper registration and payment today, or a cell phone is broadcasting entrance credentials to a secure physical site tomorrow, it is apparent that identifying infor ...
SBIR Phase I 2004 Department of CommerceNational Institute of Standards and Technology -
Development of a Laboratory Scale CD-SAXS Device for Semiconductor Metrology Applications
SBC: Jordan Valley Semiconductors, Inc. Topic: N/AA semiconductor metrology tool will be developed employing the technique of small-angle x-ray scattering (SAXS) to measure the critical dimension (CD) of patterned device structures. The feasibility of the SAXS technique to measure CD has been shown using high-power synchrotron radiation facilities which are not of practical use to the semiconductor industry. The ultimate project goal is to produc ...
SBIR Phase I 2004 Department of CommerceNational Institute of Standards and Technology -
Ontology based Computational Tools for Distributed CAD
SBC: Lateral Eye, Inc. Topic: N/ACAD CAM technologies have had an immense impact on the product development process in the last two decades. Current technologies, however, have limited knowledge representation and computational capabilities to enable collaboration of design decisions beyond commercial Internet based collaboration tools. In the Phase 1 Lateral Eye proposes to develop a new framework for Knowledge Integrated comput ...
SBIR Phase I 2004 Department of CommerceNational Institute of Standards and Technology -
Next-generation Simulation Suite for Advanced Optical Metrology
SBC: RSOFT DESIGN GROUP Topic: N/AThis proposal is aimed at developing a full software solution for the next generation advanced optical metrology. Existing simulation tools cannot meet the current and future needs of scattering-based optical metrology for semiconductor manufacturing. Our proposed work will first focus on developing an enhanced RCWA-based simulation engine with advanced algorithms for fast convergence and stabilit ...
SBIR Phase I 2004 Department of CommerceNational Institute of Standards and Technology -
Dual-Probe CD-AFM Calibration
SBC: XIDEX CORPORATION Topic: N/AXidex proposes to demonstrate the feasibility of calibrating a critical-dimension atomic force microscope (CD-AFM) without the use of a reference artifact in such a way that high-precision critical dimensions can be generated independently of changes in probe tip shape. We plan to demonstrate sub-nanometer repeatability for tip-to-tip calibration, and demonstrate single-point critical-dimension me ...
SBIR Phase II 2004 Department of CommerceNational Institute of Standards and Technology