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Award Data
The Award database is continually updated throughout the year. As a result, data for FY24 is not expected to be complete until March, 2025.
Download all SBIR.gov award data either with award abstracts (290MB)
or without award abstracts (65MB).
A data dictionary and additional information is located on the Data Resource Page. Files are refreshed monthly.
The SBIR.gov award data files now contain the required fields to calculate award timeliness for individual awards or for an agency or branch. Additional information on calculating award timeliness is available on the Data Resource Page.
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Computerized Robotic Delayering and Polishing System
SBC: SPECTRAL ENERGIES LLC Topic: DMEA18B001The proposed research and technical objectives in this project deal with computerized automatic delayering and polishing system that would be applicable to both commercial and government semiconductor device research and development with applications including Failure Analysis (FA), Fault Isolation (FI), and Reverse Engineering (RE) of semiconductor microelectronic devices. This project could hel ...
STTR Phase I 2019 Department of DefenseDefense Microelectronics Activity -
Electrochemical Micro-Capacitors Utilizing Carbon Nanostructures
SBC: ENGENIUSMICRO LLC Topic: DMEA13B001Electrochemical double-layer (ECDL) capacitors have tremendous potential as high-power delivery energy storage elements in low-volume and low-weight microelectronics systems. ECDL electrodes based on nanostructured carbon offer the potential for exception
STTR Phase I 2014 Department of DefenseDefense Microelectronics Activity -
High Energy Density Micro-Ultracapacitors through Tunable Electrolyte Confinement and Directional Transport
SBC: MAINSTREAM ENGINEERING CORP Topic: DMEA13B001The increasing penetration of MEMs devices into the commercial market has lead to an increasing demand for micro-sized electrical energy storage devices to interface with a support them. Electrochemical double layer capacitors hold significant promise as
STTR Phase I 2014 Department of DefenseDefense Microelectronics Activity -
Metrology of thin films on sapphire substrate
SBC: OPTOWARES INC Topic: DMEA16B001There is a lack of non-destructive metrology tool to measure the thickness of thin films on sapphire substrate due to the transparency of the
STTR Phase I 2017 Department of DefenseDefense Microelectronics Activity