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The Award database is continually updated throughout the year. As a result, data for FY22 is not expected to be complete until September, 2023.

Download all SBIR.gov award data either with award abstracts (290MB) or without award abstracts (65MB). A data dictionary and additional information is located on the Data Resource Page. Files are refreshed monthly.

  1. 20009- Partha

    SBC: CFD RESEARCH CORP            Topic: 20A001

    Radiation effects in microelectronics are a significant concern for DoD systems that operate at high altitudes or in outer space. Typical characterization efforts focus on macroscale degradation signatures from electrical measurements at device terminals. However, a comprehensive analysis of radiation-induced physical defects is not possible based solely on terminal measurements. CFD Research and ...

    STTR Phase II 2022 Department of DefenseDefense Microelectronics Activity
  2. Metrology of Thin Films on Sapphire Substrate

    SBC: Optowares Incorporated            Topic: DMEA16B001

    There is a lack of a non-destructive metrology tool to measure the thickness of thin films on sapphire substrates due to the transparency of the substrate. Leveraging our extensive experience building sensor systems combined with MIT Lincoln Laboratory’s expertise in theoretical modeling, we will design and build an innovative thin film measurement tool using Raman spectroscopy. Our metrology sy ...

    STTR Phase II 2019 Department of DefenseDefense Microelectronics Activity
  3. Thickness Measurement Technology for Thin Films on Sapphire Substrate

    SBC: Advanced Cooling Technologies, Inc.            Topic: DMEA16B001

    Silicon-on-sapphire (SOS) integrated circuits have achieved popularity due to their high speed performance and low power consumption in radio frequency applications. An important aspect of the SOS fabrication process that must be verified to maximize yield is the thickness of the thin films deposited on the sapphire substrate. However, due to the transparent nature of sapphire, current optical met ...

    STTR Phase II 2018 Department of DefenseDefense Microelectronics Activity
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