Award Data

Silicon-on-sapphire (SOS) integrated circuits are attracting attention due to their high speed performance and low power consumption. An important aspect of the SOS fabrication process that must be verified to maximize yield is the thickness of the thin films deposited on the sapphire substrate. However, due to the transparent nature of sapphire, current optical metrology tools are not applicable. ...

The objective of this proposal is to develop instrumentation and algorithms for acquiring facial features for facial recognition in low- and no-light conditions.We will use cross-spectrum matching by exploiting infrared polarimetric imagery which tends to show features that match more closely visible imagery than conventional infrared.In addition to thermal infrared, we will also test subjects in ...

In resource limited settings, rapid and accurate diagnosis of infections is critical for managing potential exposures to highly virulent pathogens,whether occurring from an act of bioterrorism or a natural event. This is especially important for hard to detect intracellular bacterial andalphavirus infections, that overlap symptomatically and often treated empirically due to a lack of reliable and ...

In a pandemic or exposure to weaponized Marburg virus the morbidity, mortality and social unrest that will ensue before vaccines orMilitary operating on foreign soil as well as to the population of the US Homeland. Practically all threat agents of biological origin (except forcertain non-proteinaceous toxins, typically produced by marine organisms and fungi) have their structure and vital function ...

The proposed research and technical objectives in this project deal with computerized automatic delayering and polishing system that would be applicable to both commercial and government semiconductor device research and development with applications including Failure Analysis (FA), Fault Isolation (FI), and Reverse Engineering (RE) of semiconductor microelectronic devices. This project could hel ...