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Award Data
The Award database is continually updated throughout the year. As a result, data for FY24 is not expected to be complete until March, 2025.
Download all SBIR.gov award data either with award abstracts (290MB)
or without award abstracts (65MB).
A data dictionary and additional information is located on the Data Resource Page. Files are refreshed monthly.
The SBIR.gov award data files now contain the required fields to calculate award timeliness for individual awards or for an agency or branch. Additional information on calculating award timeliness is available on the Data Resource Page.
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Microfabricated Broadband Connectors for Frequencies Above 100 GHz
SBC: Nuvotronics, LLC Topic: N/AThe region of the electromagnetic spectrum from 100 GHz to 400 GHz is currently underutilized but an area of exciting promise. Although atmospheric attenuation is higher in this region, the high frequency enables higher bandwidth operation. Transmit and receive components are also small resulting in the potential for lightweight miniature systems. Sub-millimeter waves also have the unique ability ...
SBIR Phase I 2012 Department of CommerceNational Institute of Standards and Technology -
Non-contact Inline Material Sensor for Measurement of Electrical Properties of Nanofiber Films
SBC: PANERATECH, INC. Topic: N/APaneraTech is proposing a non-contact dual sensor for broadband and real-time characterization of thin nanofiber films during the manufacturing. Our solution offers several unique aspects that are ideal for this application. For instance, it uses a dual CPW sensor for low frequencies and free space transmission system for higher frequency band. Our proposed sensor system is also equipped with high ...
SBIR Phase I 2012 Department of CommerceNational Institute of Standards and Technology -
An Automated Lapping Apparatus and Process for High- Process for High-Precision Random Profile Roughness Specimen Fabrication
SBC: X-Wave Innovations, Inc. Topic: N/AThe measurement and quality control for smooth engineering surfaces are becoming more and more important in modern science and technology due to their important engineering functions and high production costs. NIST has frequently received requests for U.S. industry to provide Standard Reference Material (SRM) high-precision, random profile roughness specimens to support smooth surface measurements ...
SBIR Phase I 2012 Department of CommerceNational Institute of Standards and Technology -
Vacuum Windows for Third Generation Syschrotron Radiation Beamlines
SBC: AVS US INC Topic: N/AImproving the quality and intensity of the x-ray beam is an important design goal for every synchrotron installation. Although small, the effects of vacuum windows on x-ray absorption and phase contrast cannot be neglected. Synchrotron x-rays have wavelengths on the order of one Angstrom (1 x 10-10m), the same order of magnitude as inter-atomic distances. These x-rays are used to study many differ ...
SBIR Phase I 2003 Department of CommerceNational Institute of Standards and Technology -
Low Damage Ion Beam Etching Technique and Method for Compositional Profiling of Thin Multilayer Films
SBC: 4WAVE, INC. Topic: N/AThin film multilayers of nanometer scale thickness are fundamental to the future of electronics and communications technologies. Chemical depth profiling by ion etching techniques are critical to the characterization of these structures. A fundamental problem with current ion etching technologies is that typical ion energies (~1k eV to 20 keV) create extensive damage and intermixing of nanometer t ...
SBIR Phase I 2003 Department of CommerceNational Institute of Standards and Technology -
Systematic Study of the Growth and Processing of ZnTe and GaP Crytals for THz Detection
SBC: BRIMROSE CORPORATION OF AMERICA Topic: N/ATerahertz radiation is an ideal candidate for non-invasive interrogation of concealed objects and substances. As such, there is an increased need for reliable high-quality nonlinear materials for the generation and detection of THz radiation. Zinc telluride (ZnTe) and gallium phosphide (GaP) are the materials of choice for this purpose. However, the performance of these materials varies widely fro ...
SBIR Phase I 2003 Department of CommerceNational Institute of Standards and Technology -
Intelligent Tools with Ambient-Powered Wirelss Sensors
SBC: LUNA INNOVATIONS INCORPORATED Topic: N/ANext-generation smart machine tools are currently under research and development. Critical to the success of these tools will be the inclusion of smart sensors. These sensor suites will need to measure physical parameters such as temperature, vibration, pressure and so on. Luna Innovations has extensive experience in developing solar powered wireless systems to transmit sensor data. Luna proposes ...
SBIR Phase I 2003 Department of CommerceNational Institute of Standards and Technology -
Development of UltrastableTi:sapphire Lasers for Optical Clock and Spectroscopy Applications
SBC: Kapteyn-Murnane Laboratories, Inc. Topic: N/AThis Small Business Innovation Research Phase 1 project proposes to develop a femtosecond laser system optimized for optical clocks and other precision metrology applications. In principle, atomic optical transitions have the potential to provide radically higher-accuracy timekeeping, because of the very high frequency of an optical transition. The problem of counting, or down-counting, the oscill ...
SBIR Phase I 2003 Department of CommerceNational Institute of Standards and Technology -
Monitor for Risk of Structural Collapse
SBC: Sekos, Inc. Topic: N/AThe focus of this SBIR submission is to develop a system to monitor fire-induced structural vibrations that provide real time data correlating with structural integrity. The system is designed to bridge an "information void" that would provide firefighters with information that can warn of impending collapse. The system, based on accelerometer technology, will monitor structural integrity through ...
SBIR Phase I 2003 Department of CommerceNational Institute of Standards and Technology -
Direct-Digital Phase & Amplitude Noise Measurement System
SBC: TIMING SOLUTIONS Topic: N/AWe propose to compare alternative architectures for phase noise measurement by directly sampling the RF waveform. Out of band modulation and cross correlation will reduce noise. The capabilities of each architecture will be determined using analysis and simulation. The results will be used to determine the feasibility of developing a commercially useful measurement instrument. If the results are p ...
SBIR Phase I 2003 Department of CommerceNational Institute of Standards and Technology