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The Award database is continually updated throughout the year. As a result, data for FY19 is not expected to be complete until April, 2020.

  1. Large-Area, High-Uniformity Photodiodes for Infrared Trap Detectors

    SBC: AMETHYST RESEARCH INCORPORATED            Topic: 9020168R

    methyst Research Inc. will design, fabricate and test a high uniformity, large area, low noise infrared trap-detector detector for the 1- 4.5 μm wavelength range. This state of the art detector will have a large area (e.g., 1-1.8 cm diameter active area) with a spatial variability of internal quantum efficiency of less than 0.1 % between 1 μm and 4.5 μm. In addition, the internal quantum effici ...

    SBIR Phase I 2015 Department of CommerceNational Institute of Standards and Technology
  2. A Tool for Building Semantically Interoperable Specification and Standards

    SBC: XSB INC.            Topic: 9010273R

    Standards and specifications are widely used in government and industry to define requirements for products and processes and insure interoperability, safety, and quality of industrial and domestic products. Specifications and standards documents almost always cross-reference other standards and specification. Taken together, the web of interdependent standards forms an immensely important knowled ...

    SBIR Phase I 2015 Department of CommerceNational Institute of Standards and Technology
  3. Optimization of the NIST/UCSF Breast Phantom

    SBC: High Precision Devices, Inc.            Topic: 9030268R

    Magnetic resonance imaging (MRI) has become a primary diagnostic tool in scientific research and clinical imaging. Despite the excellent image quality that can be obtained with today’s MRIs, images acquired using different MRI systems and during longitudinal studies are not reproducible, and hence can be difficult, if not impossible, to compare. To address this issue, a standardized test of the ...

    SBIR Phase II 2015 Department of CommerceNational Institute of Standards and Technology
  4. Microfabricated Broadband Connectors for Frequencies Above 100 GHz

    SBC: Nuvotronics, LLC            Topic: N/A

    The region of the electromagnetic spectrum from 100 GHz to 400 GHz is currently underutilized but an area of exciting promise. Although atmospheric attenuation is higher in this region, the high frequency enables higher bandwidth operation. Transmit and receive components are also small resulting in the potential for lightweight miniature systems. Sub-millimeter waves also have the unique ability ...

    SBIR Phase I 2012 Department of CommerceNational Institute of Standards and Technology
  5. Non-contact Inline Material Sensor for Measurement of Electrical Properties of Nanofiber Films

    SBC: PANERATECH, INC.            Topic: N/A

    PaneraTech is proposing a non-contact dual sensor for broadband and real-time characterization of thin nanofiber films during the manufacturing. Our solution offers several unique aspects that are ideal for this application. For instance, it uses a dual CPW sensor for low frequencies and free space transmission system for higher frequency band. Our proposed sensor system is also equipped with high ...

    SBIR Phase I 2012 Department of CommerceNational Institute of Standards and Technology
  6. Vacuum Windows for Third Generation Syschrotron Radiation Beamlines

    SBC: Advanced Design Consulting USA, Inc.            Topic: N/A

    Improving the quality and intensity of the x-ray beam is an important design goal for every synchrotron installation. Although small, the effects of vacuum windows on x-ray absorption and phase contrast cannot be neglected. Synchrotron x-rays have wavelengths on the order of one Angstrom (1 x 10-10m), the same order of magnitude as inter-atomic distances. These x-rays are used to study many differ ...

    SBIR Phase I 2003 Department of CommerceNational Institute of Standards and Technology
  7. Low Damage Ion Beam Etching Technique and Method for Compositional Profiling of Thin Multilayer Films

    SBC: 4WAVE, INC.            Topic: N/A

    Thin film multilayers of nanometer scale thickness are fundamental to the future of electronics and communications technologies. Chemical depth profiling by ion etching techniques are critical to the characterization of these structures. A fundamental problem with current ion etching technologies is that typical ion energies (~1k eV to 20 keV) create extensive damage and intermixing of nanometer t ...

    SBIR Phase I 2003 Department of CommerceNational Institute of Standards and Technology
  8. Intelligent Tools with Ambient-Powered Wirelss Sensors

    SBC: Luna Innovations Incorporated            Topic: N/A

    Next-generation smart machine tools are currently under research and development. Critical to the success of these tools will be the inclusion of smart sensors. These sensor suites will need to measure physical parameters such as temperature, vibration, pressure and so on. Luna Innovations has extensive experience in developing solar powered wireless systems to transmit sensor data. Luna proposes ...

    SBIR Phase I 2003 Department of CommerceNational Institute of Standards and Technology
  9. Development of UltrastableTi:sapphire Lasers for Optical Clock and Spectroscopy Applications

    SBC: Kapteyn-Murnane Laboratories, Inc.            Topic: N/A

    This Small Business Innovation Research Phase 1 project proposes to develop a femtosecond laser system optimized for optical clocks and other precision metrology applications. In principle, atomic optical transitions have the potential to provide radically higher-accuracy timekeeping, because of the very high frequency of an optical transition. The problem of counting, or down-counting, the oscill ...

    SBIR Phase I 2003 Department of CommerceNational Institute of Standards and Technology
  10. Direct-Digital Phase & Amplitude Noise Measurement System

    SBC: TIMING SOLUTIONS            Topic: N/A

    We propose to compare alternative architectures for phase noise measurement by directly sampling the RF waveform. Out of band modulation and cross correlation will reduce noise. The capabilities of each architecture will be determined using analysis and simulation. The results will be used to determine the feasibility of developing a commercially useful measurement instrument. If the results are p ...

    SBIR Phase I 2003 Department of CommerceNational Institute of Standards and Technology

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