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Automated In-situ Large-area De-processing of ICs with High ThroughputSBC: MICRONET SOLUTIONS INC. Topic: DMEA18B001
The objective of this proposal is to demonstrate the feasibility of producing an automated delayering and imaging system with end point detection, material density detection with built in neural network error correction. This process, coined fast Automated Delayering-Image Capture System (ADICS) leverages off of the existing Pix2Net which is a proven automated imaging 3D microchip reconstruction ...STTR Phase I 2019 Department of DefenseDefense Microelectronics Activity