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The Award database is continually updated throughout the year. As a result, data for FY20 is not expected to be complete until September, 2021.
SBC: Spectral Energies, LLC Topic: DMEA18B001
The proposed research and technical objectives in this project deal with computerized automatic delayering and polishing system that would be applicable to both commercial and government semiconductor device research and development with applications including Failure Analysis (FA), Fault Isolation (FI), and Reverse Engineering (RE) of semiconductor microelectronic devices. This project could hel ...STTR Phase I 2019 Department of DefenseDefense Microelectronics Activity
SBC: Optowares Incorporated Topic: DMEA16B001
There is a lack of a non-destructive metrology tool to measure the thickness of thin films on sapphire substrates due to the transparency of the substrate. Leveraging our extensive experience building sensor systems combined with MIT Lincoln Laboratory’s expertise in theoretical modeling, we will design and build an innovative thin film measurement tool using Raman spectroscopy. Our metrology sy ...STTR Phase II 2019 Department of DefenseDefense Microelectronics Activity