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Award Data

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The Award database is continually updated throughout the year. As a result, data for FY24 is not expected to be complete until March, 2025.

Download all SBIR.gov award data either with award abstracts (290MB) or without award abstracts (65MB). A data dictionary and additional information is located on the Data Resource Page. Files are refreshed monthly.

The SBIR.gov award data files now contain the required fields to calculate award timeliness for individual awards or for an agency or branch. Additional information on calculating award timeliness is available on the Data Resource Page.

  1. Investigation of Radiation Effects in Advanced Microelectronic Devices for developing predictive models of degradation

    SBC: CFD RESEARCH CORPORATION            Topic: 20A001

    Radiation effects in microelectronic components are a significant concern for the reliability of DoD systems that operate at high altitudes or in outer space. Typical characterization efforts focus on macroscale degradation signatures from electrical measurements at device terminals. However, a comprehensive analysis of radiation-induced physical defects is not possible based solely on terminal me ...

    STTR Phase I 2020 Department of DefenseDefense Microelectronics Activity
  2. Smart Baseplate for Additive Manufacturing

    SBC: LUNA INNOVATIONS INCORPORATED            Topic: DLA18A001

    Additive manufacturing (AM) has rapidly evolved into a valuable technique for making parts which, at times, cannot be fabricated through conventional machining methods, or for fabrication of small quantities of complex parts. One challenge in the area of AM is the lack of real-time feedback on the fabrication process and the quality of the part being made. This is especially critical given the rel ...

    STTR Phase II 2019 Department of DefenseDefense Logistics Agency
  3. Metrology of Thin Films on Sapphire Substrate

    SBC: OPTOWARES INC            Topic: DMEA16B001

    There is a lack of a non-destructive metrology tool to measure the thickness of thin films on sapphire substrates due to the transparency of the substrate. Leveraging our extensive experience building sensor systems combined with MIT Lincoln Laboratory’s expertise in theoretical modeling, we will design and build an innovative thin film measurement tool using Raman spectroscopy. Our metrology sy ...

    STTR Phase II 2019 Department of DefenseDefense Microelectronics Activity
  4. Using Magnetic Levitation for Non-Destructive Detection of Defective and Counterfeit Materiel

    SBC: Nano Terra, Inc.            Topic: DLA15C001

    The introduction of substandard or counterfeit materials into the DoD supply chain can have extremely expensive, and potentially life threatening, consequences. Current techniques used to detect nonconforming materiel can be destructive (e.g., manual sectioning and inspection of a part), time consuming and expensive (e.g., micro-computed tomography, ultrasound), or provide only limited informatio ...

    STTR Phase I 2016 Department of DefenseDefense Logistics Agency
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