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Award Data

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The Award database is continually updated throughout the year. As a result, data for FY24 is not expected to be complete until March, 2025.

Download all SBIR.gov award data either with award abstracts (290MB) or without award abstracts (65MB). A data dictionary and additional information is located on the Data Resource Page. Files are refreshed monthly.

The SBIR.gov award data files now contain the required fields to calculate award timeliness for individual awards or for an agency or branch. Additional information on calculating award timeliness is available on the Data Resource Page.

  1. Computerized Robotic Delayering and Polishing System

    SBC: SPECTRAL ENERGIES LLC            Topic: DMEA18B001

    The proposed research and technical objectives in this project deal with computerized automatic delayering and polishing system that would be applicable to both commercial and government semiconductor device research and development with applications including Failure Analysis (FA), Fault Isolation (FI), and Reverse Engineering (RE) of semiconductor microelectronic devices. This project could hel ...

    STTR Phase I 2019 Department of DefenseDefense Microelectronics Activity
  2. Additive Manufacturing Sensor Fusion Technologies for Process Monitoring and Control.

    SBC: ARCTOS Technology Solutions, LLC            Topic: DLA18A001

    Universal Technology Corporation (UTC) has teamed with the University of Dayton Research Institute (UDRI), Stratonics, and Macy Consulting to demonstrate not only the transitionability into commercial systems, but also to develop the data analytics and monitoring and control requirements to extract the full value fromseveral sensors, including the Stratonics ThermaViz, acoustic and profilometry se ...

    STTR Phase I 2018 Department of DefenseDefense Logistics Agency
  3. Smart Baseplate for Additive Manufacturing

    SBC: LUNA INNOVATIONS INCORPORATED            Topic: DLA18A001

    Additive manufacturing (AM) has rapidly evolved into a valuable technique for making parts which, at times, cannot be fabricated through conventional machining methods.One challenge in the area of AM is the lack of real-time feedback on the fabrication process and the quality of the part being made.This is especially critical given the relatively long periods of time that complex parts can require ...

    STTR Phase I 2018 Department of DefenseDefense Logistics Agency
  4. Metrology of thin films on sapphire substrate

    SBC: OPTOWARES INC            Topic: DMEA16B001

    There is a lack of non-destructive metrology tool to measure the thickness of thin films on sapphire substrate due to the transparency of the

    STTR Phase I 2017 Department of DefenseDefense Microelectronics Activity
  5. Using Magnetic Levitation for Non-Destructive Detection of Defective and Counterfeit Materiel

    SBC: Nano Terra, Inc.            Topic: DLA15C001

    The introduction of substandard or counterfeit materials into the DoD supply chain can have extremely expensive, and potentially life threatening, consequences. Current techniques used to detect nonconforming materiel can be destructive (e.g., manual sectioning and inspection of a part), time consuming and expensive (e.g., micro-computed tomography, ultrasound), or provide only limited informatio ...

    STTR Phase I 2016 Department of DefenseDefense Logistics Agency
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