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The Award database is continually updated throughout the year. As a result, data for FY22 is not expected to be complete until September, 2023.
Download all SBIR.gov award data either with award abstracts (290MB)
or without award abstracts (65MB).
A data dictionary and additional information is located on the Data Resource Page. Files are refreshed monthly.
Broadband Quadrature Mixers and I/Q Mismatch ReductionSBC: Tahoe RF Semiconductor Inc., Topic: DMEA102002
Silicon on Sapphire technology offer several advantages over bulk CMOS and BiCMOS technologies for the design of RFICs (RF Integrated Circuits) for the System on Chip radio applications. These advantages include superior radiation hardness, improved isolation between circuits, higher efficiency amplifiers, and more bandwidth per cost. In the last few years, RFIC designers have favored are Zero-IF ...SBIR Phase I 2010 Department of DefenseDefense Microelectronics Activity
Broadband Quadrature Mixers with Integrated I/Q Mismatch CalibrationSBC: CREONEX SYSTEMS INC. Topic: DMEA102002
Communication SoC technology has advanced significantly over the past ten years resulting in highly integrated radio SoC chips for standards such as wireless Wi-Fi[xx], global position system (GPS), Bluetooth (BT), 3G cellular, digital TV (DTV), and cable modems. While most radio SoC’s are narrowband (e.g. WiFi, GPS, BT, and cellular), future trends favor broadband software defined radios (SDR) ...SBIR Phase I 2010 Department of DefenseDefense Microelectronics Activity
Front End of Line and Back End of Line Layer Fabrication Partitioning for the Purpose of Design Intellectual Property (IP) ProtectionSBC: MAXENTRIC TECHNOLOGIES LLC Topic: DMEA182002
To meet the demands of the DMEA182-002 SBIR solicitation (“Front End of Line and Back End of Line Layer Fabrication Partitioning for the Purpose of Design Intellectual Property Protection”), the MaXentric and UCLA team proposes the HIGHFIVE (Heterogeneous Integration Guideline Highlighting Fabrication of Information Veiled Electronics), which provides a practical verification flow using the c ...SBIR Phase I 2019 Department of DefenseDefense Microelectronics Activity
Laser Dithering Device for Handheld Liquid Particle MeasurementsSBC: Metrolaser, Inc. Topic: DMEA182001
We propose a hand-held device that would be capable of measuring particles as small as 20 nm in liquid batches from semiconductor fabrication. The proposed system will overcome the complexities of existing in-line and batch sampling techniques and thus would reduce the operating time and cost of the fabrication process. The device will be small and easily portable and will not come in direct cont ...SBIR Phase I 2019 Department of DefenseDefense Microelectronics Activity
High-brilliance Multi-Energy X-ray Source and Optics for Rapid IC InspectionSBC: Sigray, Inc. Topic: DMEA162001
This Phase II SBIR proposal aims to develop an x-ray illumination beam system comprising a dual-target x-ray source and a set of magnifying Wolter x-ray optics for use in laboratory-based integrated circuit (IC) inspection x-ray microscopes. Due to the increasing reliance on electronics for military systems and devices, a method to quickly analyze ICs in 3D is critical. X-ray microscopy enabled by ...SBIR Phase II 2019 Department of DefenseDefense Microelectronics Activity
Handheld Liquid Particle CounterSBC: HAL Technology, LLC Topic: DMEA182001
The trend of microelectronic processing technology is for more advanced complex devices integrated in smaller size. Particles could become significantly more prevalent as killer defects and have adverse effect on fabrication yield rate. Meanwhile, clean environment control requirements originally focused on particles in the air have been extended to encompass liquids that come into direct conta ...SBIR Phase I 2019 Department of DefenseDefense Microelectronics Activity
Automated In-situ Large-area De-processing of ICs with High ThroughputSBC: MICRONET SOLUTIONS INC. Topic: DMEA18B001
The objective of this proposal is to demonstrate the feasibility of producing an automated delayering and imaging system with end point detection, material density detection with built in neural network error correction. This process, coined fast Automated Delayering-Image Capture System (ADICS) leverages off of the existing Pix2Net which is a proven automated imaging 3D microchip reconstruction ...STTR Phase I 2019 Department of DefenseDefense Microelectronics Activity
A Unified Blockchain for FPGA Firmware and HardwareSBC: COLVIN RUN NETWORKS, INC Topic: DMEA182003
FPGA units in security-sensitive applications need secure manufacturing & configuration methods to combat supply chain interdiction and compromise by adversaries, with robust Third-Party IP provenance traceability. The proposed solution uniquely meets this need with a State of the Art blockchain implementation to build a fit-for-purpose supply chain blockchain (SCBC) optimized for DMEA’s FPGA ...SBIR Phase I 2019 Department of DefenseDefense Microelectronics Activity
Through-Lens Fiducial Marking SystemSBC: Checkpoint Technologies LLC Topic: DMEA172002
Awarded Phase I and having completed the Phase I concept and feasibility study of the innovative development of a tool, Thru-Lens Fiducial Marking, that can be integrated into an IR microscope that is able to create fiducial marks on the surface of the backside of silicon, we now propose to embark on Phase II, or implementation of said technology. The current state-of-art in semiconductor device ...SBIR Phase II 2019 Department of DefenseDefense Microelectronics Activity