You are here
Award Data
The Award database is continually updated throughout the year. As a result, data for FY24 is not expected to be complete until March, 2025.
Download all SBIR.gov award data either with award abstracts (290MB)
or without award abstracts (65MB).
A data dictionary and additional information is located on the Data Resource Page. Files are refreshed monthly.
The SBIR.gov award data files now contain the required fields to calculate award timeliness for individual awards or for an agency or branch. Additional information on calculating award timeliness is available on the Data Resource Page.
-
Optimized X-ray Microscope (OXM) for IC Reverse Engineering
SBC: Xradia Topic: DMEA122001Nondestructive 3D imaging of the interconnect structure of microelectronics with x-rays has been demonstrated on an Xradia microscope at the synchrotron. The same scanning speed can be obtained in a non-synchrotron optimized x-ray microscope (OXM) by taking advantage of recent advancement in x-ray source and x-ray optics technology to be developed in the proposed project. The OXM will allow nondes ...
SBIR Phase I 2012 Department of DefenseDefense Microelectronics Activity -
High Speed, High Resolution X-ray System for Inspecting Integrated Circuits
SBC: DLA INSTRUMENTS CORPORATION Topic: DMEA122001A new type of x-ray microscope is proposed for three-dimensional imaging of integrated circuits, or IC"s. The new microscope can image at resolutions down to 25 nm, and at speeds of over 10 million pixels per second. This imaging rate is over 1000x faster than existing high-resolution x-ray systems, and can image a full 1 cm chip in a few hours; existing x-ray microscopes would take years to accom ...
SBIR Phase I 2012 Department of DefenseDefense Microelectronics Activity
