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Award Data

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The Award database is continually updated throughout the year. As a result, data for FY20 is not expected to be complete until September, 2021.

  1. Multivariate Monitor System for Plasma Etch Reactors

    SBC: Chromex Inc.            Topic: N/A

    CHROMEX proposes to develop a monitor system for plasma etch reactors that will, in the Phase I program, demonstrate much improved endpoint detection when compared to currently availabe systems. The Phase II research will extend the monitoring capabilities to all important plasma parameters. The system will provide the feedback information to the reactor controller necessary to produce a flexible ...

    SBIR Phase I 1994 Department of DefenseDefense Advanced Research Projects Agency
  2. Interleukin-8 Receptor Antagonist: A Potential Infection-Imaging Agent and Therapeutic

    SBC: Diatech, Inc.            Topic: N/A

    Interleukin-8 (IL-8), a newly characterized proinflammatory cytokine, is chemotactic for polymorphonuclear neutrophils (PMNs) and stimulates several other agonist effects, all culminating in accumulation at the site of infection or inflammation and the full plethora of effects, including tissue injury via degradative enzymes and oxygen-derived free radicals. All of these effects are mediated by sp ...

    SBIR Phase I 1994 Department of DefenseDefense Advanced Research Projects Agency
  3. Multi-Chip Integration

    SBC: International Design            Topic: N/A

    The resolution gap between available chip (sub-micron) and off-chip (100 to 125 micron) will be closed by a new laminate interconnection technology. Semiconductor manufacturing techniques, either on wafer (NChip) or in thin film form (IBM and others), are used to bring line widths and thicknesses into this resolution gap forming 10 micron lines. Problems with this technology include low yields, li ...

    SBIR Phase I 1994 Department of DefenseDefense Advanced Research Projects Agency
  4. Wet Process for Highly Uniform Oxide Etching

    SBC: CREARE LLC            Topic: N/A

    Wet etching for oxide thin films is superior to dry processes because it has extremely low contamination, eliminates water markes from the wafers, provides a high degree of process flexibility and control, has better cleanliness, and the equipment is compact. However, wet etching has had limited application because the etch uniformity is difficult to control. We propose to develop an innovative mi ...

    SBIR Phase I 1994 Department of DefenseDefense Advanced Research Projects Agency
  5. Processes for Manufacturing and Recharging Lithium Polymer Batteries to Extend Life Cycle

    SBC: CREARE LLC            Topic: N/A

    Our goal is a major advancement in the life cycle of rechargeable, solid-state lithium/polymer batteries -- a factor of ten improvement to 1000's of recharge cycles. We will achieve this goal by attacking various problems of degradation at the electrode/ electrolyte interfaces, a primary factor in limiting rechargeable life and broader commercial value of these batteries. Identification and unders ...

    SBIR Phase I 1994 Department of DefenseDefense Advanced Research Projects Agency
  6. Automated Pre-Admission Medical Insurance Eligibility and Coverage Verification

    SBC: CREARE LLC            Topic: N/A

    The cost of processing erroneous or incomplete medical care claims, or of non-reimbursed services due to incorrect, unknown or incomplete insurance information, represents a considerable out-of pocket expense for every health care provider. The proposed project will develop a system for providing health care providers with accurate and timely pre-admission verification of insurance eligibility and ...

    SBIR Phase I 1994 Department of DefenseDefense Advanced Research Projects Agency
  7. Intelligent Heat Flow Control for (Cd,Zn)Te Crystal Growth

    SBC: CREARE LLC            Topic: N/A

    N/A

    SBIR Phase I 1994 Department of DefenseDefense Advanced Research Projects Agency
  8. Post Exposure Bake Monitoring of Chemically Amplified Resists Using Scatterometry

    SBC: Sandia Systems, Inc.            Topic: N/A

    We will demonstrate the capability of scatterometry to provide a process monitor to post exposure bake of chemically amplified photoresist. Two or more scatterometers will be designed that are capable of monitoring the intensities of multiple diffraction orders that result from illuminating device patterns of photoresist. The goal is to demonstrate the capability of scatterometry to provide a PEB ...

    SBIR Phase I 1994 Department of DefenseDefense Advanced Research Projects Agency
  9. Voice Recognition for Identity Monitoring and Validation

    SBC: Sonetech Corp.            Topic: N/A

    Identification and monitoring of voice information has been seen to have multiple DOD and commercial applications. The proposed program will develop a non-realtime prototype of a text-independent speaker identification system, which is based on a nonparametric classifier, and spectral features which incorporate speech parameter dynamics. The proposed approach builds upon previous expereince in fie ...

    SBIR Phase I 1994 Department of DefenseDefense Advanced Research Projects Agency
  10. In-Situ Measurement of Plasma Deposition Coating Thickness

    SBC: TECHNICAL SOLUTIONS, INC.            Topic: N/A

    A significant problem in precision manufacturing of large parts/assemblies is the requirement to make measurements over the surfacesof these parts for a variety of reasons including inspection/quality control; control of surfacing operations such as coatings, abrasive erosion, buffing, and texturing; and generation of "as built" documentation. A specific instance of this class of problem has been ...

    SBIR Phase I 1994 Department of DefenseDefense Advanced Research Projects Agency
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