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Award Data

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The Award database is continually updated throughout the year. As a result, data for FY24 is not expected to be complete until March, 2025.

Download all SBIR.gov award data either with award abstracts (290MB) or without award abstracts (65MB). A data dictionary and additional information is located on the Data Resource Page. Files are refreshed monthly.

The SBIR.gov award data files now contain the required fields to calculate award timeliness for individual awards or for an agency or branch. Additional information on calculating award timeliness is available on the Data Resource Page.

  1. Arsine Abatement

    SBC: Advanced Technologies/Laboratories Intl            Topic: N/A

    The continued use of arsine gas and/or its derivatives is vital to the manufacture of a wide variety of semiconductor devices. While the use of arsine is growing, it poses serious environmental and safety problems in the industry. New methods must be found that permit the facile trapping and detoxification of arsine and its derivatives. Advanced Technology Materials, Inc. (ATM) has gained a reputa ...

    SBIR Phase II 1996 Department of DefenseAir Force
  2. High Performance Thin Film Microactuator Materials

    SBC: Advanced Technologies/Laboratories Intl            Topic: N/A

    The potential applications of microelectromechanical systems (MEMS) have only begun to be recognized. This technology demands thin film materials with exceptional microstructural quality for high performance and processes with high yields. For piezoelectric microactuator applications, thin film lead zirconate titanate (PZT) is the leading material choice. Furthermore, substitutional modificatio ...

    SBIR Phase II 1996 Department of DefenseAir Force
  3. Stress Analyzer for Microelectronic Devices

    SBC: Advanced Technologies/Laboratories Intl            Topic: N/A

    Multilayer thin films deposited onto Si wafers often exhibit high residual stresses during processing, leading to structural failure and/or electrical breakdown. Traditional scanning x-ray diffraction provides an accurate measurement of complex stress behavior in multilayer structures, but is difficult to carry out on a routine basis. Laser deflection methods are easy to perform but provide a li ...

    SBIR Phase II 1996 Department of DefenseAir Force
  4. Interconnect Technology for High Temperature SiC Integrated Circuits

    SBC: Advanced Technologies/Laboratories Intl            Topic: N/A

    Integration of many different devices on a single silicon carbide (SiC) substrate is necessary to realize the full potential of high temperature or high power devices for markets ranging from industrial and consumer to military systems to transportation power and control. Integration requires that the entire device package, individual devices, contacts and interconnect materials, be ...

    SBIR Phase I 1996 Department of DefenseAir Force
  5. Non-destructive Depth Dependent Stress Monitor

    SBC: Advanced Technologies/Laboratories Intl            Topic: N/A

    N/A

    SBIR Phase I 1996 Department of DefenseAir Force
  6. Electromagnetic Coupling to Satellite Cavities

    SBC: ADVANCED ELECTROMAGNETICS            Topic: N/A

    N/A

    SBIR Phase I 1996 Department of DefenseAir Force
  7. Advanced FT-IR Gas Analysis Instrument for Improved Process Monitoring and on-site Characterization

    SBC: ADVANCED FUEL RESEARCH, INC.            Topic: N/A

    N/A

    SBIR Phase I 1996 Department of DefenseAir Force
  8. Assessment of Technology for a New High Power Photolytic Iodine Laser

    SBC: Advanced Opt. Equip. & Syst.            Topic: N/A

    A great need exists for a high brightness laser which is consistent, easy-to-use, and reliable for use in industrial, scientific, and military applications. A new enhanced photolytic iodine laser is proposed which is unique in it's simultaneously available attributes. Phase I will assess scalability of a new photolytic iodine laser to higher output power than previously achieved and address manufa ...

    SBIR Phase II 1996 Department of DefenseAir Force
  9. V-LAB: A Virtual Laboratory for Structural Integrity Assissment of Composite Components

    SBC: Applied Research Associates, Inc.            Topic: N/A

    Investigation of failed composite components requires tress analysis to assess their structural integrity. Currently there exist no general-purpose software packages for composite structural analysis that are accessible to failure investigators who are not experts in these types of analysis. The proposed research and development effort will fill this void with a flexible user friendly, PC-based ...

    SBIR Phase II 1996 Department of DefenseAir Force
  10. ProFEA: A General Purpose Graphically-Based Probabilistic Finite Element Analysis System

    SBC: Applied Research Associates, Inc.            Topic: N/A

    This Phase I SBIR will develop a general purpose probabilistic finite element analysis system, ProFEA, that allows designers to perform probabilistic finite element analysis in a graphical environment that is completely familiar and similar to modern deterministic FEA. We have developed an innovative architecture that takes advantage of emerging file exchange and database standards (I ...

    SBIR Phase I 1996 Department of DefenseAir Force
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