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The Award database is continually updated throughout the year. As a result, data for FY24 is not expected to be complete until March, 2025.

Download all SBIR.gov award data either with award abstracts (290MB) or without award abstracts (65MB). A data dictionary and additional information is located on the Data Resource Page. Files are refreshed monthly.

The SBIR.gov award data files now contain the required fields to calculate award timeliness for individual awards or for an agency or branch. Additional information on calculating award timeliness is available on the Data Resource Page.

  1. Diaphragm Pressure Gauge

    SBC: KTECH CORP.            Topic: DTRA02010

    A phase I program establishing the feasibility of using a diaphragm pressure gauge (DPG) to measure the loads on a survivable shield that is an element of a debris mitigation system for Plasma Radiating Sources (PRS). These loads on a survivable shield have not been measured. DMS performance analyses have emphasized the criticality of such measurements. Simulator, e.g. Decade Half, performance ...

    SBIR Phase II 2004 Department of DefenseDefense Threat Reduction Agency
  2. N/A

    SBC: 21ST CENTURY SYSTEMS, INC.            Topic: N/A

    N/A

    SBIR Phase II 1999 Department of DefenseOffice of the Secretary of Defense
  3. N/A

    SBC: AZIMUTH INC            Topic: N/A

    N/A

    SBIR Phase II 1999 Department of DefenseOffice of the Secretary of Defense
  4. N/A

    SBC: Integrated Sciences            Topic: N/A

    N/A

    SBIR Phase II 1999 Department of DefenseDefense Threat Reduction Agency
  5. N/A

    SBC: North Star Research Corp.            Topic: N/A

    N/A

    SBIR Phase II 1999 Department of DefenseDefense Threat Reduction Agency
  6. DEVELOPMENT OF A HARDNESS ASSURANCE THROUGHPUT OPTIMIZED TESTER

    SBC: MISSION RESEARCH CORP.            Topic: N/A

    INTEGRATED CIRCUIT (IC) PRODUCTION LINES OPERATING UNDER MIL-I-38535 HAVE RADIATION HARNESS ASSURANCE (RHA) AND RELIABILITY DESIGNED AND BUILT INTO THEIR TECHNOLOGY. HARDNESS AND RELIABILITY ARE MAINTAINED BY APPLYING STATISTICAL PROCESS CONTROLS (SPCS) TO TEST STRUCTURES FABRICATED ALONGSIDE PRODUCT MICROCIRCUITS. MEASUREMENT AND DATA REDUCTION TECHNIQUES PRESENTLY EMPLOYED ARE SLOW AND COSTLY AN ...

    SBIR Phase II 1994 Department of DefenseDefense Threat Reduction Agency
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