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The Award database is continually updated throughout the year. As a result, data for FY24 is not expected to be complete until March, 2025.

Download all SBIR.gov award data either with award abstracts (290MB) or without award abstracts (65MB). A data dictionary and additional information is located on the Data Resource Page. Files are refreshed monthly.

The SBIR.gov award data files now contain the required fields to calculate award timeliness for individual awards or for an agency or branch. Additional information on calculating award timeliness is available on the Data Resource Page.

  1. GEOGENX: target disambiguation through spatiotemporal context

    SBC: VISION SYSTEMS INC            Topic: NGA201004

    Satellite platforms play a critical role in the modern defense and intelligence infrastructure, providing timely, detailed, and readily available imagery to support U.S. national security. An ever present and fundamental requirement for this type of data is automated target detection and recognition, helping to quickly locate and correctly identify targets from vast quantities of image data. Despi ...

    SBIR Phase II 2023 Department of DefenseNational Geospatial-Intelligence Agency
  2. CLOAKT (Classification of Low-shot Objects via Attributed Knowledge Transfer)

    SBC: ETEGENT TECHNOLOGIES, LTD.            Topic: NGA172002

    The intelligence community is faced with an increasingly difficult challenge: the amount of data far outstrips the number of analysts that exploit this data into actionable information. With the ever-growing number of imaging satellites in orbit the job of an analyst will change from eyes on pixels to analysis of information from imagery thanks to automated image processing like object detection a ...

    SBIR Phase II 2021 Department of DefenseNational Geospatial-Intelligence Agency
  3. High Speed, High Resolution X-ray System for Inspecting Integrated Circuits

    SBC: SVXR            Topic: DMEA122001

    The company proposes to design, build and test a prototype system for high-speed x-ray inspection. The system will be based on a new method of x-ray imaging that allows for high-NA x-ray illumination using standard laboratory (non-synchrotron) x-ray sources. A high-resolution, large field-of-view detector permits large field-of-view, high-resolution imaging.

    SBIR Phase II 2014 Department of DefenseDefense Microelectronics Activity
  4. Synthesizable Register Transfer Logic (RTL) Assertions

    SBC: EDAPTIVE COMPUTING INC            Topic: DMEA221001

    Verification and validation (V&V) of ICs have become progressively difficult as design complexity, the reuse of third-party intellectual property, and malicious attacks on microelectronics have all increased. Given these challenges, the DoD needs automated, user-friendly post-synthesis verification and validation solutions to assure its critical hardware systems. To address this need, ECI presents ...

    SBIR Phase II 2023 Department of DefenseDefense Microelectronics Activity
  5. Supply Chain Development of Thick SiC Epi-Wafers and 20 kV Class Transistors

    SBC: MAINSTREAM ENGINEERING CORP            Topic: DMEA231D02

    SiC IGBT devices remain restricted from achieving higher voltage operation due the lack of a supply chain (onshore or otherwise) for thick n-channel epitaxial wafers. Some researchers have reported success in improving SiC to accommodate higher voltage IGBTs. However, commercial exploitation of this knowledge has not occurred due to a much larger market for moderate voltage transistors. Detailed f ...

    SBIR Phase II 2023 Department of DefenseDefense Microelectronics Activity
  6. Novel Manufacturing Process for Advanced Low-Cost High-Power Epitaxy Silicon Switches

    SBC: RADIATION DETECTION TECHNOLOGIES, INC.            Topic: DMEA231D01

    Currently, the US has limited production facilities for opening switches, e.g., DSRDs, which are manufactured with very outdated manufacturing methods and technology, e.g., based on deep diffusion of dopants into a thinned silicon wafer. The goal of this effort is to develop scaled manufacturing processes, manufacture batch quantities, and enable high-volume manufacturing of semiconductor opening ...

    SBIR Phase II 2023 Department of DefenseDefense Microelectronics Activity
  7. 2nd Phase II Radiation Shielding (SI Technologies)

    SBC: SI2 TECHNOLOGIES, INC            Topic: MDA17012

    SI2 Technologies, Inc. (SI2) proposes to develop 3D-printed for spacecraft microelectronics. Leveraging SI2’s extensive additive manufacturing experience, SI2’s low-SWaP, low-cost shielding will be designed to protect both unmounted and board-mounted microelectronics. This approach will accommodate multiple types and sizes of semiconductor packages, including 484 ball Fine Pitch Ball Grid Arra ...

    SBIR Phase II 2023 Department of DefenseDefense Microelectronics Activity
  8. Robust DNA Taggant Reader for Electronics Counterfeit Prevention

    SBC: NANOHMICS INC            Topic: DMEA201001

    Defense MicroElectronics Activity (DMEA) seeks to develop a robust technique to sample and read DNA taggants applied to surfaces of microelectronics supply chain components that employs machine learning methods to develop trained models capable of detecting counterfeit microelectronic parts with > 95% accuracy. To address the need for rapid (< 5 minute) genetic taggant signature profiling rooted i ...

    SBIR Phase II 2022 Department of DefenseDefense Microelectronics Activity
  9. Machine Learning Applied to Counterfeit Detection

    SBC: GRAF RESEARCH CORPORATION            Topic: DMEA192002

    The machine learning for counterfeit detection research program continues the successful Phase 1 feasibility study of applying machine learning to detect FPGA counterfeits. In Phase 1, Graf Research demonstrated the feasibility of implementing a machine learning based counterfeit detection platform for a single FPGA device and representing data characteristic of repackaged counterfeit devices.  T ...

    SBIR Phase II 2021 Department of DefenseDefense Microelectronics Activity
  10. Rapid, Portable, Surface Texture Based Component Classifier (RAPSTEC) System

    SBC: CHROMOLOGIC LLC            Topic: DMEA192002

    In order to meet the Defense Microelectronics Activity (DMEA) need to support the ongoing Department of Defense (DOD) challenge to ensure the authenticity and security of microelectronics parts within its supply chain, ChromoLogic LLC (CLL) proposed, developed and demonstrated a Phase I RAPSTEC system. RAPSTEC is based on a machine vision system designed to capture the surface features of a microe ...

    SBIR Phase II 2021 Department of DefenseDefense Microelectronics Activity
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