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The Award database is continually updated throughout the year. As a result, data for the given year is not complete until April of the following year. Annual Reports data is a snapshot of agency reported information for that year and hence might look different from the live data in the Awards Information charts.

  1. High Speed, High Resolution X-ray System for Inspecting Integrated Circuits

    SBC: SVXR            Topic: DMEA122001

    The company proposes to design, build and test a prototype system for high-speed x-ray inspection. The system will be based on a new method of x-ray imaging that allows for high-NA x-ray illumination using standard laboratory (non-synchrotron) x-ray sources. A high-resolution, large field-of-view detector permits large field-of-view, high-resolution imaging.

    SBIR Phase II 2014 Department of DefenseDefense Microelectronics Activity
  2. High-Throughput Experimentation Physical Vapor Deposition (PVD) Chamber for Accelerated Microelectronics Materials Research and Development

    SBC: INTERMOLECULAR, INC.            Topic: DMEA07001

    The cost to maintain Moore’s law is growing exponentially with every generation of semiconductor device. To support the ever-increasing demand for smaller, faster, lower-power, and lower-cost microelectronic semiconductor devices, tools enabling faster and lower-cost research and development are required. Current development tools are only capable of achieving one data point per wafer. The goal ...

    SBIR Phase II 2008 Department of DefenseDefense Microelectronics Activity
  3. IMAGINE: Imagery Management through Agile, Geo-Interactive, Natural Embodiment

    SBC: APTIMA, INC.            Topic: NGA11002

    Overhead imagery analysts employ computer-based software as Electronic Light Tables (ELTs), to perform detailed analysis of aerial images in search of elements of interest. Conventional display design for ELT software requires analysts to take their eyes away from the image they are analyzing to perform routine functions. This interaction overhead typically leads to losses in visual momentum and i ...

    SBIR Phase II 2013 Department of DefenseNational Geospatial-Intelligence Agency
  4. Thickness Measurement Technology for Thin Films on Sapphire Substrate

    SBC: Advanced Cooling Technologies, Inc.            Topic: DMEA16B001

    Silicon-on-sapphire (SOS) integrated circuits have achieved popularity due to their high speed performance and low power consumption in radio frequency applications. An important aspect of the SOS fabrication process that must be verified to maximize yield is the thickness of the thin films deposited on the sapphire substrate. However, due to the transparent nature of sapphire, current optical met ...

    STTR Phase II 2018 Department of DefenseDefense Microelectronics Activity
  5. Low-Shot Detection in Remote Sensing Imagery

    SBC: Novateur Research Solutions, LLC            Topic: NGA172002

    This SBIR Phase II project will develop biologically inspired computational models and algorithms to enable low-shot and one-shot detectionof objects-of-interest in remote sensing imagery. The Phase II effort will build upon our Phase I work including multi-scale representationlearning framework and deep-learning based feature extraction and matching techniques for low-shot target detection. The P ...

    SBIR Phase II 2018 Department of DefenseNational Geospatial-Intelligence Agency
  6. Analysis of Integrated Circuits Using Limited X-rays

    SBC: Tangent Sciences LLC            Topic: DMEA152002

    XRadIC establishes an automated software framework to non-destructively analyze cutting edge microelectronics using photon flux-limited x-ray microscope systems. XRadIC couples on-the-fly sample scanning with online optimized 2D and 3D image analysis algorithms to maximize overall system throughput by dynamically minimizing the number of viewing angles and exposure times needed to analyze a given ...

    SBIR Phase II 2018 Department of DefenseDefense Microelectronics Activity
  7. Low-Shot Detection in Remote Sensing Imagery

    SBC: ETEGENT TECHNOLOGIES, LTD.            Topic: NGA172002

    With the ever-growing number of imaging satellites in orbit the job of an analyst will change from eyes on pixels to analysis of informationfrom imagery thanks to automated image processing like object detection and change detection. Object detection algorithms have advancedto near human performance given that there is sufficient labeled data on which to train; however, obtaining this data is cost ...

    SBIR Phase II 2018 Department of DefenseNational Geospatial-Intelligence Agency
  8. High-Efficiency Integrated Si APD Quantum Key Receiver

    SBC: Freedom Photonics LLC            Topic: DMEA142001


    SBIR Phase II 2017 Department of DefenseDefense Microelectronics Activity
  9. Nano-Resolution Three-Dimensional Integrated Circuit ReconstructionSystem


    To address the DMEA need for accurate identification and analysis of semiconductor materials with high-resolution imaging of integratedcircuits (ICs), Physical Optics Corporation (POC) developed and evaluated the feasibility of novel Nano-Resolution Three-DimensionalIntegrated Circuit Reconstruction (NEOTERIC) System for in situ full reverse engineering of ICs based on swing nanolaminography and a ...

    SBIR Phase II 2016 Department of DefenseDefense Microelectronics Activity
  10. Broadband Quadrature Mixers with Integrated I/Q Mismatch Calibration

    SBC: CREONEX SYSTEMS INC.            Topic: DMEA102002

    Communication SoC technology has advanced significantly over the past ten years resulting in highly integrated radio SoC chips for standards such as Wi-Fi, global position system (GPS), Bluetooth (BT), 3G cellular, digital TV (DTV), and cable modems. While most radio SoC"s are narrowband (e.g. WiFi, GPS, BT, and cellular), future trends favor broadband software defined radios (SDR) and cognit ...

    SBIR Phase II 2013 Department of DefenseDefense Microelectronics Activity

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