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Award Data

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The Award database is continually updated throughout the year. As a result, data for FY20 is not expected to be complete until September, 2021.

  1. High-Throughput Manufacturing Methods for Engineered MRI Contrast Agents

    SBC: ADVANCED RESEARCH CORPORATION            Topic: 9010368R

    This project focuses on developing a magnetic resonance imaging (MRI) contrast agent that may increase the detection of tagged cells by a factor of 10-100. The ability to noninvasively track specifically labeled (tagged) cells, enables a researcher or medical treatment professional to dynamically monitor the delivery and targeted application of medicinal and bio-reactive agents.

    SBIR Phase I 2015 Department of CommerceNational Institute of Standards and Technology
  2. Large-Area, High-Uniformity Photodiodes for Infrared Trap Detectors

    SBC: Amethyst Research Incorporated            Topic: 9020168R

    methyst Research Inc. will design, fabricate and test a high uniformity, large area, low noise infrared trap-detector detector for the 1- 4.5 μm wavelength range. This state of the art detector will have a large area (e.g., 1-1.8 cm diameter active area) with a spatial variability of internal quantum efficiency of less than 0.1 % between 1 μm and 4.5 μm. In addition, the internal quantum effici ...

    SBIR Phase I 2015 Department of CommerceNational Institute of Standards and Technology
  3. Decision Support Tools for Sustainable Manufacturing

    SBC: BIMCON Inc.            Topic: N/A

    The objective of this proposal is to establish the feasibility of developing an integrated decision support tool that transforms the current time-consuming and reactive (post-design) sustainability assessment into a real-time, proactive approach available in the early phases of product design. This tool, called Sustainability Integrated into Early Design (SIED), will define and capture lifecycle-w ...

    SBIR Phase I 2010 Department of CommerceNational Institute of Standards and Technology
  4. 300 mm High Density Temperature Probe Card for Wafer- Level Reliability Testing

    SBC: Celadon Systems Inc.            Topic: N/A

    Historical methods of reliability assessment are less and less effective as device sizes shrink. Already researchers are unable to package the many advanced devices because the act of cutting the wafer and the packaging operation pre-stresses or destroys the devices resulting in unreliable test results. Additionally the increasing cost of fabricating a wafer with advanced integrated circuit techno ...

    SBIR Phase I 2010 Department of CommerceNational Institute of Standards and Technology
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