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The Award database is continually updated throughout the year. As a result, data for FY24 is not expected to be complete until March, 2025.

Download all SBIR.gov award data either with award abstracts (290MB) or without award abstracts (65MB). A data dictionary and additional information is located on the Data Resource Page. Files are refreshed monthly.

The SBIR.gov award data files now contain the required fields to calculate award timeliness for individual awards or for an agency or branch. Additional information on calculating award timeliness is available on the Data Resource Page.

  1. Large-Area, High-Uniformity Photodiodes for Infrared Trap Detectors

    SBC: AMETHYST RESEARCH INC            Topic: 9020168R

    methyst Research Inc. will design, fabricate and test a high uniformity, large area, low noise infrared trap-detector detector for the 1- 4.5 μm wavelength range. This state of the art detector will have a large area (e.g., 1-1.8 cm diameter active area) with a spatial variability of internal quantum efficiency of less than 0.1 % between 1 μm and 4.5 μm. In addition, the internal quantum effici ...

    SBIR Phase I 2015 Department of CommerceNational Institute of Standards and Technology
  2. Standard Robot Platform Designed for Unstructured Environment Research

    SBC: TARGAZYME, INC.            Topic: N/A

    Robotic researchers currently are using insufficient and varying robot platforms to investigate issues crucial to the successful development of a remote reconnaissance tool for the urban search and rescue (USAR) community. USAR robotic researchers need a standard robot platform designed for research in unstructured environments. This platform would accelerate the research essential to advancing re ...

    SBIR Phase I 2004 Department of CommerceNational Institute of Standards and Technology
  3. Development of a Laboratory Scale CD-SAXS Device for Semiconductor Metrology Applications

    SBC: Jordan Valley Semiconductors, Inc.            Topic: N/A

    A semiconductor metrology tool will be developed employing the technique of small-angle x-ray scattering (SAXS) to measure the critical dimension (CD) of patterned device structures. The feasibility of the SAXS technique to measure CD has been shown using high-power synchrotron radiation facilities which are not of practical use to the semiconductor industry. The ultimate project goal is to produc ...

    SBIR Phase I 2004 Department of CommerceNational Institute of Standards and Technology
  4. Microresonator-based High-performance High-pressure Sensor

    SBC: Nomadics, Inc.            Topic: N/A

    In this Phase I SBIR, Nomadics will build on our past experience with micro-structure resonators and quartz-based sensors to develop a pressure sensor suitable for high pressure applications such as oil and gas industry applications. In the Phase I work, the outstanding measurement resolution of our sensing technology will be demonstrated and the feasibility of this technology for pressure sensing ...

    SBIR Phase I 2004 Department of CommerceNational Institute of Standards and Technology
  5. Ultra-High Vacuum Compatible Wavelength Dispersive X-ray Spectrometer

    SBC: PARALLAX RESEARCH INC            Topic: N/A

    Parallax Research, Inc. proposes to develop an Ultra-High Vacuum Compatible Wavelength Dispersive X-ray Spectrometer for use on Field Emission Scanning Electron Microscopes, Transmission Electron Microscopes, Auger Spectroscopy Systems, and X-ray Photo-electron Spectroscopy Systems. We propose to build on Parallax's designs of innovative parallel beam x-ray spectrometers and incorporate new types ...

    SBIR Phase I 2004 Department of CommerceNational Institute of Standards and Technology
  6. Dual-Probe CD-AFM Calibration

    SBC: XIDEX CORPORATION            Topic: N/A

    Xidex proposes to demonstrate the feasibility of calibrating a critical-dimension atomic force microscope (CD-AFM) without the use of a reference artifact in such a way that high-precision critical dimensions can be generated independently of changes in probe tip shape. We plan to demonstrate sub-nanometer repeatability for tip-to-tip calibration, and demonstrate single-point critical-dimension me ...

    SBIR Phase II 2004 Department of CommerceNational Institute of Standards and Technology
  7. V-PSL and VISI_PSL: A Visual Language and Interactive Tool for PSL Generation

    SBC: Computer Aided Process Improvement, Inc.            Topic: N/A

    We propose developing a prototype of a GUI-based wizard that: ¿ Guides users through the steps that are needed to define their processes using PSL in a visual/textual manner. ¿ Checks for consistency/correctness according to PSL ontology. ¿ Generates the PSL description. We believe that VISI-PSL will facilitate the generation of PSL descriptions to the extent that it will be used by process ...

    SBIR Phase I 2003 Department of CommerceNational Institute of Standards and Technology
  8. Advanced Tools for Process Specification Language

    SBC: KNOWLEDGE BASED SYSTEMS INC            Topic: N/A

    This project will (i) extend and harden the PSL Editor and the Ontology-Driven XSLT Generator (ODXG) tools and (ii) extend the process description syntax (PDS) derived from the PSL for both KIF and XML/RDF formats. In addition, we will extend the PSL metatheoretical framework to support the PDS and the PSL tools by providing PSL extensions to support calendars and activity specialization, and by d ...

    SBIR Phase II 2003 Department of CommerceNational Institute of Standards and Technology
  9. PSL-based Process Knowledge Integration and Management Framework

    SBC: KNOWLEDGE BASED SYSTEMS INC            Topic: N/A

    We propose to develop a robust framework, called the Process Knowledge Integration and Management Framework (PKIMF), to support the complete lifecycle of enterprise process knowledge that natively use the Process Specification Language (PSL). PKIMF uses a dashboard approach to design, analyze, integrate, exchange, and manage process knowledge. Its features and capabilities include the use of a pro ...

    SBIR Phase I 2003 Department of CommerceNational Institute of Standards and Technology
  10. Development of Multifunctional Open-system Sensor Integration Tool (MOSIT)

    SBC: WILLIAMSRDM, INC.            Topic: N/A

    Williams-Pyro, Inc. proposes to model and develop software to provide an interface allowing a common method of incorporating sensing components within different systems. The proposed software package, called the Multifunctional Open-system Sensor Integration Tool (MOSIT), will provide the circuit designer with a complete sensor interface solution. MOSIT will provide not only the Network Capable Ap ...

    SBIR Phase I 2003 Department of CommerceNational Institute of Standards and Technology
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