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Award Data

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The Award database is continually updated throughout the year. As a result, data for FY21 is not expected to be complete until September, 2022.

Download all SBIR.gov award data either with award abstracts (290MB) or without award abstracts (65MB). A data dictionary and additional information is located on the Data Resource Page. Files are refreshed monthly.

  1. High-brilliance Multi-Energy X-ray Source and Optics for Rapid IC Inspection

    SBC: Sigray, Inc.            Topic: DMEA162001

    This Phase II SBIR proposal aims to develop an x-ray illumination beam system comprising a dual-target x-ray source and a set of magnifying Wolter x-ray optics for use in laboratory-based integrated circuit (IC) inspection x-ray microscopes. Due to the increasing reliance on electronics for military systems and devices, a method to quickly analyze ICs in 3D is critical. X-ray microscopy enabled by ...

    SBIR Phase II 2019 Department of DefenseDefense Microelectronics Activity
  2. Through-Lens Fiducial Marking System

    SBC: Checkpoint Technologies LLC            Topic: DMEA172002

    Awarded Phase I and having completed the Phase I concept and feasibility study of the innovative development of a tool, Thru-Lens Fiducial Marking, that can be integrated into an IR microscope that is able to create fiducial marks on the surface of the backside of silicon, we now propose to embark on Phase II, or implementation of said technology. The current state-of-art in semiconductor device ...

    SBIR Phase II 2019 Department of DefenseDefense Microelectronics Activity
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