Award Data

In this Phase I SBIR proposal, SandBox Semiconductor™ proposes to develop an Advanced Manufacturing and Material Measurements software tool called Weave ™ for accelerating and automating SEM image analysis for the semiconductor industry. During the development of a new manufacturing process line for a semiconductor device, tens of thousands of scanning electron microscopy (SEM) images are take ...

Alphacore proposes Dr. Yago Gonzalez-Velo as the principal investigator (PI) for this SBIR program. Dr. Gonzalez-Velo has experience ranging from radiation effects, characterization to implementation of novel technologies in the BEOL of CMOS circuits. Dr Gonzalez Velo has gained experience in BEOL layer design, as well as photolithography mask design, and MEMS manufacturing experience through dif ...

Modern Model-Based Enterprise / Engineering (MBE) systems rely on freeform surfaces built as complex combinations of geometric primitives to define engineered objects. Unfortunately, the intersection of freeform surfaces in MBE applications results in highly approximated solutions, degrading models that cost billions annually by US industry to fix. Current technology limits the abilities of users ...

Alphacore will develop an Intermediate Frequency (IF) Conversion System for High-Bandwidth Multiplexed Sensors Arrays for Phase II of NIST's 2018 soliciation for Exploratory Measurement Science Topic 9.04.02.68.The proposing team has already successfully developed and evaluated a prototype board in Phase I.The goal in Phase II is therefore to achieve three primary objectives:1) Optimize the design ...

This project will develop a new scientific instrument optimized for the advanced characterization of near-infrared fluorescent nanoparticles that can exist as left- or right-handed structures (enantiomers). Single-walled carbon nanotubes (SWCNTs) are the leading current example of such nanomaterials. Applied NanoFluorescence, LLC (ANF) proposes a novel multi-mode chiroptical spectrometer that can ...

Through-lens laser fiducial marking systems can greatly increase throughput of semiconductor Failure Analysis (FA) labs, that do not have access to CAD drawings of the devices they are trying to analyze.  Creating fiducial marks at points of interest on a semiconductor device allows the device to move and be analyzed by different FA equipment easily and quickly. In Phase I, a suitable laser was ...