The Award database is continually updated throughout the year. As a result, data for FY19 is not expected to be complete until September, 2020.
Advanced Manufacturing and Material Measurements Software Tool Weave ™ for the Acceleration and Automation of SEM Image Analysis in the Semiconductor IndustrySBC: Sandbox Semiconductor Incorporated Topic: None
In this Phase I SBIR proposal, SandBox Semiconductor™ proposes to develop an Advanced Manufacturing and Material Measurements software tool called Weave ™ for accelerating and automating SEM image analysis for the semiconductor industry. During the development of a new manufacturing process line for a semiconductor device, tens of thousands of scanning electron microscopy (SEM) images are take ...SBIR Phase I 2019 Department of CommerceNational Institute of Standards and Technology
SBC: Nvariate, Inc. Topic: None
Modern Model-Based Enterprise / Engineering (MBE) systems rely on freeform surfaces built as complex combinations of geometric primitives to define engineered objects. Unfortunately, the intersection of freeform surfaces in MBE applications results in highly approximated solutions, degrading models that cost billions annually by US industry to fix. Current technology limits the abilities of users ...SBIR Phase I 2019 Department of CommerceNational Institute of Standards and Technology
Fulcrum Biometrics' Plan for Research and Development of WS-BD Conformant Handheld Fingerprint SensorSBC: Fulcrum Biometrics, LLC Topic: N/A
Trusted biometric validation of individual identities has never been more important. Several contributing factors are the increase in global terrorism, identity theft and the increase in legislation which are driving the accelerated adoption of biometric technology. Unfortunately, the biometrics industry has not actively responded to the changing market conditions being driven by the explosion in ...SBIR Phase I 2012 Department of CommerceNational Institute of Standards and Technology