Award Data

For best search results, use the search terms first and then apply the filters
Reset

The Award database is continually updated throughout the year. As a result, data for FY19 is not expected to be complete until June, 2020.

  1. Combined Cleaning and Guided Wave Inspection System for Hazardous Liquid Pipelines

    SBC: ULC Robotics, Inc.            Topic: 180PH2

    Pipeline operators employ cleaning tools for improving product throughput, inhibiting corrosion, and preparing their pipes for inline inspection. For many pipeline risk models, improving the scope and quality of input data is a long-term process. If the combined cost of pigging and inspecting was low and could be done simultaneously, pipeline operators would be encouraged to perform inspections mo ...

    SBIR Phase II 2019 Department of Transportation
  2. Guided Augmented Independence Travel Aid (GAIT-Aid)

    SBC: Design Interactive, Inc            Topic: 180FT1

    Lack of transportation access affects approximately 30% of people with functional limitations. In fact, people with functional limitations experience transportation access barriers four times more than those without limitations. With the emerging market of low cost augmented and virtual reality technology, perceptual user interfaces (PUI) that interact more naturalistically with end-users are prov ...

    SBIR Phase II 2019 Department of Transportation
  3. On-board Smart Vision System to Support Vehicle-to-Infrastructure (V2I) Communication

    SBC: Connected Wise LLC            Topic: 180FH1

    Connected automated vehicle (CAV) technology has significant implications in terms of transportation system safety and efficiency. However, building and maintaining a wireless communication infrastructure (e.g. roadside units (RSUs), power, fiber optic lines etc.) across the U.S. is a challenging task. In urban areas, where vehicle population and vehicle-miles-traveled (VMT) are high, building suc ...

    SBIR Phase II 2019 Department of Transportation
  4. Dual Plane 3D Compton Scattering Imager with Pixelated CZT Detectors for 1-10MeV Gamma Ray

    SBC: H3D            Topic: None

    Phase I has proven that the current setup achieves better than 8mm spatial resolution for 2.2MeV prompt gammas. However, 1mm spatial resolution presents a significant challenge for the current setup due in part to limited timing resolution and count rate. A new analog ASIC will be developed to replace the current analog ASIC that will have better timing resolution and deliver higher count rates. I ...

    SBIR Phase II 2019 Department of CommerceNational Institute of Standards and Technology
  5. Multimode Chiroptical Spectrometer for Nanoparticle Characterization

    SBC: Applied Nanofluorescence LLC            Topic: None

    This project will develop a new scientific instrument optimized for the advanced characterization of near-infrared fluorescent nanoparticles that can exist as left- or right-handed structures (enantiomers). Single-walled carbon nanotubes (SWCNTs) are the leading current example of such nanomaterials. Applied NanoFluorescence, LLC (ANF) proposes a novel multi-mode chiroptical spectrometer that can ...

    SBIR Phase II 2019 Department of CommerceNational Institute of Standards and Technology
  6. Advanced Instrumentation for Non-Nulling Stack Velocity Testing

    SBC: AIRFLOW SCIENCES CORPORATION            Topic: None

    Industrial facilities, manufacturing plants, and electric power plants that burn fossil fuels exhaust the combustion products to atmosphere through their smokestacks. Stack pollutant emissions are quantified using manual testing methods developed in the 1960s, which are prone to error if non-axial flow exists in a stack.Recently, NIST has been working on an improved technique of performing 3D flow ...

    SBIR Phase I 2019 Department of CommerceNational Institute of Standards and Technology
  7. Advanced Manufacturing and Material Measurements Software Tool Weave ™ for the Acceleration and Automation of SEM Image Analysis in the Semiconductor Industry

    SBC: Sandbox Semiconductor Incorporated            Topic: None

    In this Phase I SBIR proposal, SandBox Semiconductor™ proposes to develop an Advanced Manufacturing and Material Measurements software tool called Weave ™ for accelerating and automating SEM image analysis for the semiconductor industry. During the development of a new manufacturing process line for a semiconductor device, tens of thousands of scanning electron microscopy (SEM) images are take ...

    SBIR Phase I 2019 Department of CommerceNational Institute of Standards and Technology
  8. Development of a Neutron-based Nondestructive Test Method for Concrete Petrography and Chemical Analysis

    SBC: TOURNEY CONSULTING GROUP, LLC            Topic: None

    To evaluate the technical feasibility of prompt gamma neutron activation (PGAA) as an alternative to a set of standard destructive tests of concrete petrography including aggregate type, water/cement ratio, aggregate/binder ratio, density, chloride content and chloride bulk diffusion constant; and to determine the specifications for the design of a dedicated commercial laboratory-based PGAA facili ...

    SBIR Phase I 2019 Department of CommerceNational Institute of Standards and Technology
  9. Nanomachine Device for Semiconductor Process Control Monitoring

    SBC: Xallent LLC            Topic: None

    Conventional characterization and test methods are increasingly ineffective when applied to structures less than 100 nanometers, causing challenges across R&D, process control and failure analysis. An increasing number of subtle defects become prominent drivers of failure as device size and operating margins decrease, e.g., processing anomalies in thin gate oxides, substrate problems related to do ...

    SBIR Phase I 2019 Department of CommerceNational Institute of Standards and Technology
  10. Gap-Free Model-Based Engineering for Manufacturing and Analysis: Digital Thread without Translation

    SBC: Nvariate, Inc.            Topic: None

    Modern Model-Based Enterprise / Engineering (MBE) systems rely on freeform surfaces built as complex combinations of geometric primitives to define engineered objects. Unfortunately, the intersection of freeform surfaces in MBE applications results in highly approximated solutions, degrading models that cost billions annually by US industry to fix. Current technology limits the abilities of users ...

    SBIR Phase I 2019 Department of CommerceNational Institute of Standards and Technology
US Flag An Official Website of the United States Government