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Award Data
The Award database is continually updated throughout the year. As a result, data for FY24 is not expected to be complete until March, 2025.
Download all SBIR.gov award data either with award abstracts (290MB)
or without award abstracts (65MB).
A data dictionary and additional information is located on the Data Resource Page. Files are refreshed monthly.
The SBIR.gov award data files now contain the required fields to calculate award timeliness for individual awards or for an agency or branch. Additional information on calculating award timeliness is available on the Data Resource Page.
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Wavelength-Agile Real Time Tabletop X-ray Nanoscope based on High Harmonic Beams
SBC: Kapteyn-Murnane Laboratories, Inc. Topic: ST15C001Nanoscale, material sensitive, imaging techniques are critical for progress in many disciplines as we learn to master science and technology at the smallest dimensions — on the nanometer to atomic-scale. However, progress in both science and technology is becoming increasingly limited by the constraints of current imaging techniques and metrologies. Fortunately, by combining coherent extreme UV ...
STTR Phase II 2019 Department of DefenseDefense Advanced Research Projects Agency -
Processes for Fabrication of Atomically Precise Strongly Correlated Materials
SBC: XALLENT INC. Topic: ST17C002Developing knowledge-driven nanoelectronics for military applications requires understanding the fundamental physics that governs the behavior of the underlying material. Strongly correlated materials have very desirable properties such as interfacial superconductivity, ferroelectricity, ferromagnetism, and huge magnetoresistance, which make them an ideal set of candidates to integrate with semico ...
STTR Phase II 2019 Department of DefenseDefense Advanced Research Projects Agency -
Portable Microwave Cold Atomic Clock
SBC: SPECTRADYNAMICS INC Topic: SB141004We present the design of a small, portable, microwave cold atomic clock that meets the frequency stability requirement of < 8X10-13 at 1 s averaging time and < 3X10-15 for an averaging time of 1 day. The entire clock is about the size of a desktop computer 18.75 ” X 14.75 ” X 8.77 ” (47.6 cm X 37.5 cm X 22.3 cm) and weighs 30.5 kg. The clock can run on both 100-240 VAC as well as +24 VDC. St ...
SBIR Phase II 2019 Department of DefenseDefense Advanced Research Projects Agency -
Dual Plane 3D Compton Scattering Imager with Pixelated CZT Detectors for 1-10MeV Gamma Ray
SBC: H3D INC Topic: NonePhase I has proven that the current setup achieves better than 8mm spatial resolution for 2.2MeV prompt gammas. However, 1mm spatial resolution presents a significant challenge for the current setup due in part to limited timing resolution and count rate. A new analog ASIC will be developed to replace the current analog ASIC that will have better timing resolution and deliver higher count rates. I ...
SBIR Phase II 2019 Department of CommerceNational Institute of Standards and Technology -
Multimode Chiroptical Spectrometer for Nanoparticle Characterization
SBC: APPLIED NANOFLUORESCENCE, LLC Topic: NoneThis project will develop a new scientific instrument optimized for the advanced characterization of near-infrared fluorescent nanoparticles that can exist as left- or right-handed structures (enantiomers). Single-walled carbon nanotubes (SWCNTs) are the leading current example of such nanomaterials. Applied NanoFluorescence, LLC (ANF) proposes a novel multi-mode chiroptical spectrometer that can ...
SBIR Phase II 2019 Department of CommerceNational Institute of Standards and Technology -
Lightweight High Temperature Structural TPS for Hypersonic Flight
SBC: ADVANCED POWDER SOLUTIONS INC Topic: SB171013AAA BBB CCC
SBIR Phase II 2019 Department of DefenseDefense Advanced Research Projects Agency -
Gap-Free Model-Based Engineering for Manufacturing and Analysis: Digital Thread without Translation
SBC: Nvariate, Inc. Topic: NoneModern Model-Based Enterprise / Engineering (MBE) systems rely on freeform surfaces built as complex combinations of geometric primitives to define engineered objects. Unfortunately, the intersection of freeform surfaces in MBE applications results in highly approximated solutions, degrading models that cost billions annually by US industry to fix. Current technology limits the abilities of users ...
SBIR Phase I 2019 Department of CommerceNational Institute of Standards and Technology -
Advanced Instrumentation for Non-Nulling Stack Velocity Testing
SBC: AIRFLOW SCIENCES CORP Topic: NoneIndustrial facilities, manufacturing plants, and electric power plants that burn fossil fuels exhaust the combustion products to atmosphere through their smokestacks. Stack pollutant emissions are quantified using manual testing methods developed in the 1960s, which are prone to error if non-axial flow exists in a stack.Recently, NIST has been working on an improved technique of performing 3D flow ...
SBIR Phase I 2019 Department of CommerceNational Institute of Standards and Technology -
Easy-to-use, Autonomous Bin-picking and Assembly Operations for the Manufacturing Industry
SBC: Robotic Materials Inc. Topic: NoneWe will develop a series of object manipulation primitives to pick up and assemble standard mechanical parts such as screws, gears and pulleys that can be configured without any programming skills. Building up on a smart robotic gripper, 3D perception and machine learning algorithms, we will design a graphical user interface for the Universal Robot E-Series that allows an user to label arbitrary 3 ...
SBIR Phase I 2019 Department of CommerceNational Institute of Standards and Technology -
Advanced Manufacturing and Material Measurements Software Tool Weave ™ for the Acceleration and Automation of SEM Image Analysis in the Semiconductor Industry
SBC: Sandbox Semiconductor Incorporated Topic: NoneIn this Phase I SBIR proposal, SandBox Semiconductor™ proposes to develop an Advanced Manufacturing and Material Measurements software tool called Weave ™ for accelerating and automating SEM image analysis for the semiconductor industry. During the development of a new manufacturing process line for a semiconductor device, tens of thousands of scanning electron microscopy (SEM) images are take ...
SBIR Phase I 2019 Department of CommerceNational Institute of Standards and Technology